The constant need for higher performance and more advanced functionality has made the design and manufacturing of modern electronic chips highly demanding. Moreover, the use of smaller transistors in modern chips has increased their sensitivity to aging and faults, hence the need to constantly monitor the correct operation of these chips. To address the challenges and requirements, it has become common to embed extra hardware modules in the chips to assist in the design and manufacturing processes, as well as in monitoring the correct operation of the chips. Such modules, commonly referred to as on-chip instruments, are used through the entire life cycle of the chip, from the early prototyping phase to when the system incorporating that chi...
As the complexity of VLSI designs grows, the amount of embedded instrumentation in system-on-a-chip ...
Reconfigurable scan networks (RSNs), like IEEE Std. 1687 networks, offer flexible and scalable acces...
Modern systems-on-chips rely on embedded instruments for testing and debugging, the same instruments...
The constant need for higher performance and more advanced functionality has made the design and man...
As transistors in integrated circuits (ICs) are becoming smaller, faster and more, it has become har...
Modern integrated circuits (ICs) include thousands of on-chip instruments to ensure that specificati...
The ever-increasing need for higher performance and more complex functionality pushes the electronic...
The semiconductor technology development con- stantly enables integrated circuits (ICs) with more, f...
Modern integrated circuits (ICs) contain thousands of instruments to enable testing, tuning, monitor...
IEEE 1687 enables flexible access to the embedded (on-chip) instruments that are needed for post-sil...
To facilitate smooth VLSI development and improve chip dependability, VLSI designs incorporate instr...
We address access control of reconfigurable scan networks, like IEEE Std. 1687 networks. We propose ...
Accessing embedded test and monitoring circuitry (the so-called embedded instruments) in in-field pr...
IEEE 1687 (iJTAG) standard introduces a methodology for accessing the increasing number of embedded ...
IEEE 1687 enables flexible access to on-chip instruments via dynamically reconfigurable networks. Re...
As the complexity of VLSI designs grows, the amount of embedded instrumentation in system-on-a-chip ...
Reconfigurable scan networks (RSNs), like IEEE Std. 1687 networks, offer flexible and scalable acces...
Modern systems-on-chips rely on embedded instruments for testing and debugging, the same instruments...
The constant need for higher performance and more advanced functionality has made the design and man...
As transistors in integrated circuits (ICs) are becoming smaller, faster and more, it has become har...
Modern integrated circuits (ICs) include thousands of on-chip instruments to ensure that specificati...
The ever-increasing need for higher performance and more complex functionality pushes the electronic...
The semiconductor technology development con- stantly enables integrated circuits (ICs) with more, f...
Modern integrated circuits (ICs) contain thousands of instruments to enable testing, tuning, monitor...
IEEE 1687 enables flexible access to the embedded (on-chip) instruments that are needed for post-sil...
To facilitate smooth VLSI development and improve chip dependability, VLSI designs incorporate instr...
We address access control of reconfigurable scan networks, like IEEE Std. 1687 networks. We propose ...
Accessing embedded test and monitoring circuitry (the so-called embedded instruments) in in-field pr...
IEEE 1687 (iJTAG) standard introduces a methodology for accessing the increasing number of embedded ...
IEEE 1687 enables flexible access to on-chip instruments via dynamically reconfigurable networks. Re...
As the complexity of VLSI designs grows, the amount of embedded instrumentation in system-on-a-chip ...
Reconfigurable scan networks (RSNs), like IEEE Std. 1687 networks, offer flexible and scalable acces...
Modern systems-on-chips rely on embedded instruments for testing and debugging, the same instruments...