The growing number of circuits implemented in Field Programmable Gate Arrays (FPGAs) and the increased susceptibility, due to higher integration levels, of these devices to soft faults caused by radiation at ground level is leading the scientific and technical community to the study of new fault tolerant designs and solutions, and how they can be verified and validated. Using fault injection techniques and enhanced debug tools to inject faults in a circuit and observing its behaviour in the presence of such faults, respectively, is a proven solution for the previous verification and validation problem. This paper presents the underlying concepts for a remote verification framework to assess the robustness of circuits to soft faul...
Advances in semiconductor technology using smaller sizes of transistors in order to fit more of them...
Mitigation techniques, such as TMR, are used to reduce the negative effects of radiation on FPGAs de...
The resilience of communication systems to soft errors is a major concern in many scenarios, such as...
FPGAs are a ubiquitous electronic component utilised in a wide range of electronic systems across ma...
XXI Conference on Design of Circuits and Integrated Systems (DCIS06)The outstanding versatility of S...
The outstanding versatility of SRAM-based FPGAs make them the preferred choice for implementing comp...
This thesis describes a technology and methodology designed and developed for the study of certain a...
Due to technology scaling, which means reduced transistor size, higher density, lower voltage and mo...
Due to technology scaling, which means smaller transistor, lower voltage and more aggressive clock f...
This book introduces the concepts of soft errors in FPGAs, as well as the motivation for using comme...
Modern SRAM-based Field Programmable Gate Ar- rays (FPGAs) are increasingly employed in safety- and ...
textDependability and fault tolerance are important aspects of modern computer systems. Particle str...
Mitigation techniques, such as TMR with repair, are used to reduce the negative effects of radiation...
The appearance of nanometer technologies has produced a significant increase of integrated circuit s...
ISBN 978-1-61208-149-6International audienceApplications increasingly rely on secure embedded system...
Advances in semiconductor technology using smaller sizes of transistors in order to fit more of them...
Mitigation techniques, such as TMR, are used to reduce the negative effects of radiation on FPGAs de...
The resilience of communication systems to soft errors is a major concern in many scenarios, such as...
FPGAs are a ubiquitous electronic component utilised in a wide range of electronic systems across ma...
XXI Conference on Design of Circuits and Integrated Systems (DCIS06)The outstanding versatility of S...
The outstanding versatility of SRAM-based FPGAs make them the preferred choice for implementing comp...
This thesis describes a technology and methodology designed and developed for the study of certain a...
Due to technology scaling, which means reduced transistor size, higher density, lower voltage and mo...
Due to technology scaling, which means smaller transistor, lower voltage and more aggressive clock f...
This book introduces the concepts of soft errors in FPGAs, as well as the motivation for using comme...
Modern SRAM-based Field Programmable Gate Ar- rays (FPGAs) are increasingly employed in safety- and ...
textDependability and fault tolerance are important aspects of modern computer systems. Particle str...
Mitigation techniques, such as TMR with repair, are used to reduce the negative effects of radiation...
The appearance of nanometer technologies has produced a significant increase of integrated circuit s...
ISBN 978-1-61208-149-6International audienceApplications increasingly rely on secure embedded system...
Advances in semiconductor technology using smaller sizes of transistors in order to fit more of them...
Mitigation techniques, such as TMR, are used to reduce the negative effects of radiation on FPGAs de...
The resilience of communication systems to soft errors is a major concern in many scenarios, such as...