Full implementation of the new generation of lead-free solders requires a detailed knowledge and understanding of their mechanical behavior. This paper reports an investigation of the creep behavior of three lead-free alloys: Sn-0.5 Cu, Sn-3.5 Ag, and Sn-3.8Ag-0.7Cu, at 75°C, and compares their response to that of Sn-37Pb at the same temperature. In terms of stress and time to rupture, the Sn-0.5Cu alloy behaves similarly to the eutectic Sn-Pb over the range of rupture lives considered (up to 1000 h). The silver-containing alloys exhibit much greater creep resistance, typically a hundred fold and a thousand fold for the binary and tenanary, respectively. These alloys are less ductile but their creep strains to failure are generally above te...
peer-reviewedThis thesis presents an investigation of the influence of silver content on the creep ...
creep behavior of bulk Sn-3.5Ag solder were studied as a function of cooling rate. Controlled coolin...
To ensure reliable design of soldered interconnections as electronic devices become smaller, require...
Describes the creep behavior of three Sn-rich solders that have become candidates for use in Pb-free...
A critical survey of the current literature on creep behavior of Pb-free Sn based Sn-Ag-Cu (SAC) all...
In order to acquire relevant creep characteristics such as stress exponent and activation energy, cr...
With the continued miniaturisation of electronics equipment, a more detailed examination of the mech...
Service conditions experienced by interconnections are becoming increasingly arduous. Temperature ra...
The creep properties of Sn-8mass%Zn-3mass%Bi were investigated and compared with those of other lead...
Describes the creep behavior of three Sn-rich solders that have become candidates for use in Pb-fre...
Electronic equipment is facing the challenge of both miniaturisation and the need to replace lead in...
Reliability is a principal objective in electronics equipment. This imposes a significant challenge,...
The paper aims to examine the creep performance of lead-free solder, SAC387 (95.5Sn-3.8Ag-0.7Cu) at ...
This thesis presents an investigation of the influence of silver content on the creep behaviour of t...
Although there seems to be agreement that the SnAgCu-solder is the lead-free alloy of choice, the ba...
peer-reviewedThis thesis presents an investigation of the influence of silver content on the creep ...
creep behavior of bulk Sn-3.5Ag solder were studied as a function of cooling rate. Controlled coolin...
To ensure reliable design of soldered interconnections as electronic devices become smaller, require...
Describes the creep behavior of three Sn-rich solders that have become candidates for use in Pb-free...
A critical survey of the current literature on creep behavior of Pb-free Sn based Sn-Ag-Cu (SAC) all...
In order to acquire relevant creep characteristics such as stress exponent and activation energy, cr...
With the continued miniaturisation of electronics equipment, a more detailed examination of the mech...
Service conditions experienced by interconnections are becoming increasingly arduous. Temperature ra...
The creep properties of Sn-8mass%Zn-3mass%Bi were investigated and compared with those of other lead...
Describes the creep behavior of three Sn-rich solders that have become candidates for use in Pb-fre...
Electronic equipment is facing the challenge of both miniaturisation and the need to replace lead in...
Reliability is a principal objective in electronics equipment. This imposes a significant challenge,...
The paper aims to examine the creep performance of lead-free solder, SAC387 (95.5Sn-3.8Ag-0.7Cu) at ...
This thesis presents an investigation of the influence of silver content on the creep behaviour of t...
Although there seems to be agreement that the SnAgCu-solder is the lead-free alloy of choice, the ba...
peer-reviewedThis thesis presents an investigation of the influence of silver content on the creep ...
creep behavior of bulk Sn-3.5Ag solder were studied as a function of cooling rate. Controlled coolin...
To ensure reliable design of soldered interconnections as electronic devices become smaller, require...