The move towards lower cost sources of solar silicon has intensified efforts to investigate the possibilities of passivating or reducing the recombination activity caused by deep states associated with transition metals. This is particularly important for the case of the slow diffusing metals early in the periodic sequence which are not removed by conventional gettering. In this paper we examine reactions between hydrogen and transition metals and discuss the possibility of such reactions during cell processing. We analyse the case of hydrogenation of iron in p-type Si and show that FeH can form under non-equilibrium conditions. We consider the electrical activity of the slow diffusing metals Ti, V and Mo, how this is affected in the presen...
AbstractThe bulk minority carrier lifetime of p-type Cz-silicon material decreases due to light indu...
Abstract—Incorporation of hydrogen has a strong effect on the characteristics of silicon devices. A ...
The structures and energies of model defects consisting of copper and hydrogen in silicon are calcul...
Interstitial iron in crystalline silicon has a much larger capture cross section for electrons than ...
We review our recent studies on the reactions of hydrogen with transition-metals (Pd, Pt, Ag, and Au...
This work contains the most comprehensive qualitative and quantitative electron beam induced current...
The thermodynamics of several reactions involving atomic and molecular hydrogen with group-III accep...
The understanding of the electrical properties of defects introducing deep levels in silicon is of p...
Effective hydrogenation of interstitial iron in boron-doped multicrystalline silicon wafers is repor...
The dissociation of iron-boron pairs (FeB) in Czochralski silicon under strong illumination was inve...
Sufficient passivation of recombination active defects in the bulk of crystalline silicon solar cell...
An overview of the studies done by the authors on the physicochemical behaviour of some impurities (...
The material quality of multicrystalline silicon is influenced by crystal defects and contaminations...
The dissolution and gettering of iron is studied during the final fabrication step of multicrystalli...
AbstractThe dissolution and gettering of iron is studied during the final fabrication step of multic...
AbstractThe bulk minority carrier lifetime of p-type Cz-silicon material decreases due to light indu...
Abstract—Incorporation of hydrogen has a strong effect on the characteristics of silicon devices. A ...
The structures and energies of model defects consisting of copper and hydrogen in silicon are calcul...
Interstitial iron in crystalline silicon has a much larger capture cross section for electrons than ...
We review our recent studies on the reactions of hydrogen with transition-metals (Pd, Pt, Ag, and Au...
This work contains the most comprehensive qualitative and quantitative electron beam induced current...
The thermodynamics of several reactions involving atomic and molecular hydrogen with group-III accep...
The understanding of the electrical properties of defects introducing deep levels in silicon is of p...
Effective hydrogenation of interstitial iron in boron-doped multicrystalline silicon wafers is repor...
The dissociation of iron-boron pairs (FeB) in Czochralski silicon under strong illumination was inve...
Sufficient passivation of recombination active defects in the bulk of crystalline silicon solar cell...
An overview of the studies done by the authors on the physicochemical behaviour of some impurities (...
The material quality of multicrystalline silicon is influenced by crystal defects and contaminations...
The dissolution and gettering of iron is studied during the final fabrication step of multicrystalli...
AbstractThe dissolution and gettering of iron is studied during the final fabrication step of multic...
AbstractThe bulk minority carrier lifetime of p-type Cz-silicon material decreases due to light indu...
Abstract—Incorporation of hydrogen has a strong effect on the characteristics of silicon devices. A ...
The structures and energies of model defects consisting of copper and hydrogen in silicon are calcul...