AbstractAn accessory for a commercial optical microscope was implemented to map the thermal diffusivity of the sample with high spatial resolution. The system is based in the photothermal technique recently developed by the group. It consists in the measurement with a probe laser of the surface curvature induced by the heat delivered by a modulated pump laser. A lock-in detection technique provides the signal amplitude and phase as a function of the modulation frequency. The accessory was mounted on the camera port of a metallographic microscope Olympus BX51. Results obtained on different samples are presented
<p></p><p>ABSTRACT A novel system allowing a high spatial resolution mapping of the thermal diffusiv...
Semiconductors are essential to all technology fields. The continuous need for higher speeds and hig...
A frequency scan photothermal reflectance technique to measure thermal diffusivity of bulk samples i...
AbstractAn accessory for a commercial optical microscope was implemented to map the thermal diffusiv...
Se presenta el desarrollo de un novedoso sistema que permite el mapeo con alta resolución espacial d...
The photothermal methods (indirect detection of the temperature increase of a sample after absorpti...
Numerous photothermal displacement techniques have been developed [1–5] to obtain both thermal and s...
The calculation of photothermal response detected by a photothermal microscope is presented. By usin...
Journal ArticleA new high resolution thermal microscope has been demonstrated capable of imaging the...
It is proposed to transfer the capabilities of a high sensitivity photothermal technique, developed ...
An innovative focus error detection method is presented that is only sensitive to surface curvature ...
Papers presented to the 12th International Conference on Heat Transfer, Fluid Mechanics and Thermody...
A photothermal microscope devoted to microscopic thermal and thermo-elastic characterizations is pr...
Photothermal-optical-beam-deflection (PTOBD) imaging involves use of a focused, modulated laser beam...
A novel photothermal microscopy (PTM) is developed which uses only one laser beam, working as both t...
<p></p><p>ABSTRACT A novel system allowing a high spatial resolution mapping of the thermal diffusiv...
Semiconductors are essential to all technology fields. The continuous need for higher speeds and hig...
A frequency scan photothermal reflectance technique to measure thermal diffusivity of bulk samples i...
AbstractAn accessory for a commercial optical microscope was implemented to map the thermal diffusiv...
Se presenta el desarrollo de un novedoso sistema que permite el mapeo con alta resolución espacial d...
The photothermal methods (indirect detection of the temperature increase of a sample after absorpti...
Numerous photothermal displacement techniques have been developed [1–5] to obtain both thermal and s...
The calculation of photothermal response detected by a photothermal microscope is presented. By usin...
Journal ArticleA new high resolution thermal microscope has been demonstrated capable of imaging the...
It is proposed to transfer the capabilities of a high sensitivity photothermal technique, developed ...
An innovative focus error detection method is presented that is only sensitive to surface curvature ...
Papers presented to the 12th International Conference on Heat Transfer, Fluid Mechanics and Thermody...
A photothermal microscope devoted to microscopic thermal and thermo-elastic characterizations is pr...
Photothermal-optical-beam-deflection (PTOBD) imaging involves use of a focused, modulated laser beam...
A novel photothermal microscopy (PTM) is developed which uses only one laser beam, working as both t...
<p></p><p>ABSTRACT A novel system allowing a high spatial resolution mapping of the thermal diffusiv...
Semiconductors are essential to all technology fields. The continuous need for higher speeds and hig...
A frequency scan photothermal reflectance technique to measure thermal diffusivity of bulk samples i...