AbstractConcept, design and realization of cantilever arrays probes with self-sensing and self-actuating cantilevers and integrated sharp silicon tips for parallel surface scanning are described. Each cantilever is equipped with a piezoresistive deflection sensor and a thermal bimorph actuator enabling an individual tip-sample distance control. The characteristics of the fabricated arrays as well as parallel surface scan results are shown
Self-sensing techniques for atomic force microscope (AFM) cantilevers have several advantageous char...
We have developed an atomic force microscope that uses interferometry for parallel readout of a cant...
Microinjection molding was employed to fabricate low-cost polymer cantilever arrays for sensor appli...
Silicon cantilever arrays with a very small pitch for parallel AFM operations were studied. We fabri...
AbstractMicrocantilevers are used in a number of applications including atomic-force microscopy (AFM...
Microcantilevers are used in a number of applications including atomic-force microscopy (AFM). In th...
Cantilever arrays are employed to increase the throughput of imaging and manipulation at the nanosca...
A fabrication process for realising two-dimensional cantilever arrays for parallel force spectroscop...
Since the invention of atomic force microscopy (AFM) researchers have been trying to increase imagin...
AbstractWe present 2D cantilever arrays for parallel AFM and their fabrication process using a silic...
A cantilever transducer system with platinum tip electrodes in sub micron regime has been fabricated...
An array of microbeams is a promising approach to increase the throughput of scanning probe microsco...
An atomic force microscopy sensor includes a substrate, a cantilever beam and an electrostatic actua...
An atomic force microscopy sensor includes a substrate, a cantilever beam and an electrostatic actua...
Rectangular piezoresistive cantilevers with stress concentration holes opened were designed and fabr...
Self-sensing techniques for atomic force microscope (AFM) cantilevers have several advantageous char...
We have developed an atomic force microscope that uses interferometry for parallel readout of a cant...
Microinjection molding was employed to fabricate low-cost polymer cantilever arrays for sensor appli...
Silicon cantilever arrays with a very small pitch for parallel AFM operations were studied. We fabri...
AbstractMicrocantilevers are used in a number of applications including atomic-force microscopy (AFM...
Microcantilevers are used in a number of applications including atomic-force microscopy (AFM). In th...
Cantilever arrays are employed to increase the throughput of imaging and manipulation at the nanosca...
A fabrication process for realising two-dimensional cantilever arrays for parallel force spectroscop...
Since the invention of atomic force microscopy (AFM) researchers have been trying to increase imagin...
AbstractWe present 2D cantilever arrays for parallel AFM and their fabrication process using a silic...
A cantilever transducer system with platinum tip electrodes in sub micron regime has been fabricated...
An array of microbeams is a promising approach to increase the throughput of scanning probe microsco...
An atomic force microscopy sensor includes a substrate, a cantilever beam and an electrostatic actua...
An atomic force microscopy sensor includes a substrate, a cantilever beam and an electrostatic actua...
Rectangular piezoresistive cantilevers with stress concentration holes opened were designed and fabr...
Self-sensing techniques for atomic force microscope (AFM) cantilevers have several advantageous char...
We have developed an atomic force microscope that uses interferometry for parallel readout of a cant...
Microinjection molding was employed to fabricate low-cost polymer cantilever arrays for sensor appli...