Growth and Characterization of La2Zr2O7 Buffer Layers Deposited by Chemical Solution Deposition
- Armenio, A. Angrisani
- Augieri, A.
- Fabbri, F.
- Freda, R.
- Galluzzi, V.
- Mancini, A.
- Rizzo, F.
- Rufoloni, A.
- Vannozzi, A.
- Sotgiu, G.
- Pompeo, N.
- Torokhtii, K.
- Silva, E.
- Bemporad, E.
- Contini, G.
- Celentano, G.
DOIAbstract
AbstractThe deposition and characterization of La2Zr2O7 thin films deposited by metal-organic decomposition method on both single crystal SrTiO3 and cube textured Ni-5 at.%W substrates are presented. Metal acetylacetonates in propionic acid solution was used. The results showed that LZO films are epitaxially grown with smooth surface with rms roughness around 2nm. YBa2Cu3O7-δ films, deposited by pulsed laser deposition technique on LZO buffer layers, showed critical temperature of 90K and critical current density in self magnetic field Jc = 1.6 and 13 MA/cm2 at 77K and 4.2K, respectively. A better Jc retention in magnetic field for YBCO films deposited on LZO/STO than YBCO on bare STO is observed indicating a rather strong vortex pinning as...
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