AbstractIn this paper, we present a number of algorithms to test the instruction decoding function of microprocessors. The algorithms are based on the knowledge of some timing and control information available to users through microprocessor manuals and data sheets. The tests are functional in nature. We also establish the order of complexity of the algorithms presented in this paper. As an example, the test complexity for a microprocessor is computed and the results are compared with a known algorithm
Abstract—The main problem is test data generation for arithmetic subsystem testing of CPUs MIPS64. A...
Abstract — Design complexity of todays microprocessors is in-creasing at an alarming rate to cope up...
AbstractThis project involves the real time simulation of hardware fault and analyzing the impact on...
AbstractIn this paper, we present a number of algorithms to test the instruction decoding function o...
All microprocessor units have a similar architecture from which a basic test philosophy can be adopt...
With the growing use of the microprocessors the problematics of testing become more and more import...
textAt-speed functional tests are an important part of the manufacturing test flow of processors. W...
Design modifications in microprocessors are recommended to simplify the task of testing them in the ...
We propose a low cost concurrent error detection strategy to improve the Reliability, Availability, ...
1 This paper addresses the problem of testing path delay faults in a microprocessor using instructi...
We propose a low cost concurrent error detection strategy to improve the Reliability, Availability, ...
A methodology for on-line testing of microprocessors without using massive redundancy is developed. ...
The gate-level testing also called low-level testing is generally appropriate at the design time and...
The paper addresses the issue of microprocessor and microcontroller testing, and follows an approach...
Two candidate microprocessors are selected to demonstrate that microprocessors can be effectively ut...
Abstract—The main problem is test data generation for arithmetic subsystem testing of CPUs MIPS64. A...
Abstract — Design complexity of todays microprocessors is in-creasing at an alarming rate to cope up...
AbstractThis project involves the real time simulation of hardware fault and analyzing the impact on...
AbstractIn this paper, we present a number of algorithms to test the instruction decoding function o...
All microprocessor units have a similar architecture from which a basic test philosophy can be adopt...
With the growing use of the microprocessors the problematics of testing become more and more import...
textAt-speed functional tests are an important part of the manufacturing test flow of processors. W...
Design modifications in microprocessors are recommended to simplify the task of testing them in the ...
We propose a low cost concurrent error detection strategy to improve the Reliability, Availability, ...
1 This paper addresses the problem of testing path delay faults in a microprocessor using instructi...
We propose a low cost concurrent error detection strategy to improve the Reliability, Availability, ...
A methodology for on-line testing of microprocessors without using massive redundancy is developed. ...
The gate-level testing also called low-level testing is generally appropriate at the design time and...
The paper addresses the issue of microprocessor and microcontroller testing, and follows an approach...
Two candidate microprocessors are selected to demonstrate that microprocessors can be effectively ut...
Abstract—The main problem is test data generation for arithmetic subsystem testing of CPUs MIPS64. A...
Abstract — Design complexity of todays microprocessors is in-creasing at an alarming rate to cope up...
AbstractThis project involves the real time simulation of hardware fault and analyzing the impact on...