La consulta íntegra de la tesi, inclosos els articles no comunicats públicament per drets d'autor, es pot realitzar prèvia petició a l'Arxiu de la UPCIn future scenarios of low power and low voltage the electronic systems will present a high error ratio or voltage fluctuations due to dramatically signal to noise ratio. These transient errors can affect the logical results in a permanent way. In this thesis it has shown a new logic based on multiple redundant lines for each logical node as an alternative to strategies based on triple redundancy (TMR) within a fault-tolerant stage. The probability distribution of voltages in a noisy digital node can be described, as the union of two Gaussian distributions centred on the 0-and 1-logical, in t...
Technology scaling poses an increasing challenge to the reliability of digital circuits. Hardware re...
With the increasing demand for more durable products, the necessity of designing more resilient prod...
Thesis (S.M.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer S...
In future scenarios of low power and low voltage the electronic systems will present a high error ra...
This paper presents a new redundant logia design concept named Turtle Logic(TL).It is a new probabil...
This paper presents a new redundant logia design concept named Turtle Logic(TL).It is a new probabil...
The concept worked in this paper named Turtle Logic (TL) is a probabilistic logic method based on po...
The concept worked in this paper named Turtle Logic (TL) is a probabilistic logic method based on po...
As devices and operating voltages are scaled down, future circuits will be plagued by higher soft er...
As devices and operating voltages are scaled down, future circuits will be plagued by higher soft er...
Future electronic devices are expected to operate at lower voltage supply to save power, especially ...
Future electronic devices are expected to operate at lower voltage supply to save power, especially ...
Technology scaling poses an increasing challenge to the reliability of digital circuits. Hardware re...
Technology scaling poses an increasing challenge to the reliability of digital circuits. Hardware re...
Technology scaling poses an increasing challenge to the reliability of digital circuits. Hardware re...
Technology scaling poses an increasing challenge to the reliability of digital circuits. Hardware re...
With the increasing demand for more durable products, the necessity of designing more resilient prod...
Thesis (S.M.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer S...
In future scenarios of low power and low voltage the electronic systems will present a high error ra...
This paper presents a new redundant logia design concept named Turtle Logic(TL).It is a new probabil...
This paper presents a new redundant logia design concept named Turtle Logic(TL).It is a new probabil...
The concept worked in this paper named Turtle Logic (TL) is a probabilistic logic method based on po...
The concept worked in this paper named Turtle Logic (TL) is a probabilistic logic method based on po...
As devices and operating voltages are scaled down, future circuits will be plagued by higher soft er...
As devices and operating voltages are scaled down, future circuits will be plagued by higher soft er...
Future electronic devices are expected to operate at lower voltage supply to save power, especially ...
Future electronic devices are expected to operate at lower voltage supply to save power, especially ...
Technology scaling poses an increasing challenge to the reliability of digital circuits. Hardware re...
Technology scaling poses an increasing challenge to the reliability of digital circuits. Hardware re...
Technology scaling poses an increasing challenge to the reliability of digital circuits. Hardware re...
Technology scaling poses an increasing challenge to the reliability of digital circuits. Hardware re...
With the increasing demand for more durable products, the necessity of designing more resilient prod...
Thesis (S.M.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer S...