An instrument, adding the capability to measure 3D volumetric chemical composition, has been constructed by me as a member of the Sánchez Nano Laboratory. The laboratory\u27s in situ atomic force microscope (AFM) and secondary ion mass spectrometry systems (SIMS) are functional and integrated as one instrument. The SIMS utilizes a Ga focused ion beam (FIB) combined with a quadrupole mass analyzer. The AFM is comprised of a 6-axis stage, three coarse axes and three fine. The coarse stage is used for placing the AFM tip anywhere inside a (13x13x5 mm3) (xyz) volume. Thus the tip can be moved in and out of the FIB processing region with ease. The planned range for the Z-axis piezo was 60 µm, but was reduced after it was damaged from arc events....
In this work, the integration of an atomic force microscope (AFM) into a helium ion microscope (HIM)...
The atomic force microscope (AFM) is a very high-resolution type of Scanning Probe Microscopy (SPM)....
Industry is progressively moving towards complex 3D architectures and using advanced materials and h...
Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA...
Atomic force microscopy (AFM) is a well-known tool for studying surface roughness and to collect dep...
La spectrométrie de masse d’ion secondaire (SIMS) est probablement la technique d'analyse chimique l...
Thesis: S.M., Massachusetts Institute of Technology, Department of Mechanical Engineering, 2015.Cata...
Thesis: Ph. D., Massachusetts Institute of Technology, Department of Mechanical Engineering, 2015.Ca...
Nanotechnology is the branch of science which deals with the manipulation of matters at an extremely...
Atomic force microscopy (AFM) is well known for its ability to image and measure surface properties....
International audienceSecondary-ion mass spectrometry (SIMS) is probably the most widely used chemic...
Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee,...
Secondary ion mass spectrometry (SIMS) has wide application for in situ geochronology, trace element...
ABSTRACT: Imaging with cluster secondary ion mass spectrometry (SIMS) is reaching a mature level of ...
The use of ion microbeams as probes for computed tomography has proven to be a powerful tool for the...
In this work, the integration of an atomic force microscope (AFM) into a helium ion microscope (HIM)...
The atomic force microscope (AFM) is a very high-resolution type of Scanning Probe Microscopy (SPM)....
Industry is progressively moving towards complex 3D architectures and using advanced materials and h...
Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA...
Atomic force microscopy (AFM) is a well-known tool for studying surface roughness and to collect dep...
La spectrométrie de masse d’ion secondaire (SIMS) est probablement la technique d'analyse chimique l...
Thesis: S.M., Massachusetts Institute of Technology, Department of Mechanical Engineering, 2015.Cata...
Thesis: Ph. D., Massachusetts Institute of Technology, Department of Mechanical Engineering, 2015.Ca...
Nanotechnology is the branch of science which deals with the manipulation of matters at an extremely...
Atomic force microscopy (AFM) is well known for its ability to image and measure surface properties....
International audienceSecondary-ion mass spectrometry (SIMS) is probably the most widely used chemic...
Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee,...
Secondary ion mass spectrometry (SIMS) has wide application for in situ geochronology, trace element...
ABSTRACT: Imaging with cluster secondary ion mass spectrometry (SIMS) is reaching a mature level of ...
The use of ion microbeams as probes for computed tomography has proven to be a powerful tool for the...
In this work, the integration of an atomic force microscope (AFM) into a helium ion microscope (HIM)...
The atomic force microscope (AFM) is a very high-resolution type of Scanning Probe Microscopy (SPM)....
Industry is progressively moving towards complex 3D architectures and using advanced materials and h...