A novel experimental technique for extracting the linewidth broadening factor of semiconductor lasers is proposed. This approach is applicable to any types of diode lasers, both below- and above-threshold, and is insensitive to thermal effects.Peer reviewed: YesNRC publication: Ye
In this letter we consider the effect of fast thermal fluctuations of electronic state occupancy on ...
Abstract: Round-Robin measurements on the linewidth enhancement factor are carried out withi
A new method for the measurement of the linewidth enhancement factor of semiconductor lasers is pres...
© 2019 The Author (s). A new method for measuring linewidth enhancement factor of a semiconductor la...
© 2019 The Author (s). A new method for measuring linewidth enhancement factor of a semiconductor la...
© 2019 The Author(s). A new method for measuring linewidth enhancement factor of a semiconductor las...
International audienceLinewidth measurements of singlemode and multimode InGaAsP lasers were made ab...
International audienceLinewidth measurements of singlemode and multimode InGaAsP lasers were made ab...
A simple method for measuring the linewidth enhancement factor (LEF) of semiconductor lasers (SLs) i...
International audienceRound-Robin measurements on the linewidth enhancement factor are carried out w...
International audienceRound-Robin measurements on the linewidth enhancement factor are carried out w...
International audienceRound-Robin measurements on the linewidth enhancement factor are carried out w...
A simple model for the linewidth enhancement factor alpha and its frequency dependence in semiconduc...
More and more applications require semiconductor lasers distinguished not only by large modulation b...
Spectral-width broadening has many factors. Diode lasers are not always monochromatic due to several...
In this letter we consider the effect of fast thermal fluctuations of electronic state occupancy on ...
Abstract: Round-Robin measurements on the linewidth enhancement factor are carried out withi
A new method for the measurement of the linewidth enhancement factor of semiconductor lasers is pres...
© 2019 The Author (s). A new method for measuring linewidth enhancement factor of a semiconductor la...
© 2019 The Author (s). A new method for measuring linewidth enhancement factor of a semiconductor la...
© 2019 The Author(s). A new method for measuring linewidth enhancement factor of a semiconductor las...
International audienceLinewidth measurements of singlemode and multimode InGaAsP lasers were made ab...
International audienceLinewidth measurements of singlemode and multimode InGaAsP lasers were made ab...
A simple method for measuring the linewidth enhancement factor (LEF) of semiconductor lasers (SLs) i...
International audienceRound-Robin measurements on the linewidth enhancement factor are carried out w...
International audienceRound-Robin measurements on the linewidth enhancement factor are carried out w...
International audienceRound-Robin measurements on the linewidth enhancement factor are carried out w...
A simple model for the linewidth enhancement factor alpha and its frequency dependence in semiconduc...
More and more applications require semiconductor lasers distinguished not only by large modulation b...
Spectral-width broadening has many factors. Diode lasers are not always monochromatic due to several...
In this letter we consider the effect of fast thermal fluctuations of electronic state occupancy on ...
Abstract: Round-Robin measurements on the linewidth enhancement factor are carried out withi
A new method for the measurement of the linewidth enhancement factor of semiconductor lasers is pres...
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