Analytical modeling and experimental validation of threshold voltage in BSIM6 MOSFET model
- Agarwal, Harshit
- Gupta, Chetan
- Kushwaha, Pragya
- Yadav, Chandan
- Duarte, Juan P
- Khandelwal, Sourabh
- Hu, Chenming
- Chauhan, Yogesh S
Publication date
January 2015
DOI Publisher
Institute of Electrical and Electronics Engineers (IEEE) ISSN
2168-6734 Journal
IEEE Journal of the Electron Devices Society Citation count (estimate)
10Abstract
In this paper, an analytical model of threshold voltage for bulk MOSFET is developed. The model is derived from the physical charge-based core of BSIM6 MOSFET model, taking into account short channel effects, and is intended to be used in commercial SPICE simulators for operating point information. The model is validated with measurement data from IBM 90-nm technology node using various popular threshold voltage extraction techniques, and good agreement is obtained.4 page(s
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