We present an improved offset-short vector-network-analyzer calibration method which allows to identify broadband equivalent-circuit models of the offset-short standards and an imperfect thru connection. Our approach is based on the multi-frequency formulation of the vector-network-analyzer calibration problem in which parameters of the models are identified simultaneously with the vector-network-analyzer calibration coefficients at all frequencies. Thus, the impact of the constraints imposed by the models is also reflected in the calibration coefficients. We illustrate our approach with experimental results for an offset-short calibration in coaxial 3.5 mm connector. These results demonstrate that our method reduces the impact of measureme...
Calibration of leaky multiport vector network analyzers can be a long and time consuming procedure, ...
At least three known standards are normally required for the full two-port test fixture calibration ...
Network analysis methods allow to determine the frequency dependence of impedance standards in the s...
An Improved Short-Open-Load-Reciprocal (SOLR) Vector Network Analyzer (VNA) calibration is developed...
An Improved Short-Open-Load-Reciprocal (SOLR) Vector Network Analyzer (VNA) calibration is developed...
An Improved Short-Open-Load-Reciprocal (SOLR) Vector Network Analyzer (VNA) calibration is developed...
We present a strategy for correcting for imperfect interfaces between the test ports of a vector net...
In this paper, two calibration methods are investigated to determine the most suitable approach for ...
An improved Short-Open-Load-Thru (SOLT) on-wafer vector network calibration method for broad-band ac...
Abstract—In this paper, a new theoretical analysis of the four-standards line-reflect-reflect-match ...
An improved Short-Open-Load-Thru (SOLT) on-wafer vector network calibration method for broad-band ac...
Modern Vector Network Analyzers are powerful vector measurement systems for high frequency device ch...
A calibration procedure for a perturbation two-port vector network analyzer is presented. It consist...
In this paper, a new theoretical analysis of the four-standards line-reflect-reflect-match (LRRM) ve...
With the availability of multi-port vector network analyzers, the need for automated, calibrated mea...
Calibration of leaky multiport vector network analyzers can be a long and time consuming procedure, ...
At least three known standards are normally required for the full two-port test fixture calibration ...
Network analysis methods allow to determine the frequency dependence of impedance standards in the s...
An Improved Short-Open-Load-Reciprocal (SOLR) Vector Network Analyzer (VNA) calibration is developed...
An Improved Short-Open-Load-Reciprocal (SOLR) Vector Network Analyzer (VNA) calibration is developed...
An Improved Short-Open-Load-Reciprocal (SOLR) Vector Network Analyzer (VNA) calibration is developed...
We present a strategy for correcting for imperfect interfaces between the test ports of a vector net...
In this paper, two calibration methods are investigated to determine the most suitable approach for ...
An improved Short-Open-Load-Thru (SOLT) on-wafer vector network calibration method for broad-band ac...
Abstract—In this paper, a new theoretical analysis of the four-standards line-reflect-reflect-match ...
An improved Short-Open-Load-Thru (SOLT) on-wafer vector network calibration method for broad-band ac...
Modern Vector Network Analyzers are powerful vector measurement systems for high frequency device ch...
A calibration procedure for a perturbation two-port vector network analyzer is presented. It consist...
In this paper, a new theoretical analysis of the four-standards line-reflect-reflect-match (LRRM) ve...
With the availability of multi-port vector network analyzers, the need for automated, calibrated mea...
Calibration of leaky multiport vector network analyzers can be a long and time consuming procedure, ...
At least three known standards are normally required for the full two-port test fixture calibration ...
Network analysis methods allow to determine the frequency dependence of impedance standards in the s...