Evolution of residual micro phase and orientation dependent stresses during cold wire drawing

The residual grain and phase microstress evolutions in the ferrite matrix of pearlitic wires after several steps of cold wire drawing have been studied. Energy dispersive synchrotron diffraction revealed a significant divergence in the grain microstress evolution among differently oriented ferrite grains in the high deformation regime beyond accumulated true strain level εt ≥ 2.3.The possible physical reason for the observed divergence is discussed in terms of distinct microstructure development in this stage of the cold wire drawing.status: publishe