We propose a microscopic model of the amorphization of silicon such as that resulting from ion implantation. We demonstrate that amorphization can be induced by the presence of defects provided they form clusters embedded in a defective crystalline matrix. Our results are in striking agreement with transmission-electron microscopy measurements and confirm the superlinear dependence of damage on deposited energy, supporting the view that the crystal-to-amorphous transition proceeds via nucleation and growth.Peer reviewe
Positron annihilation spectroscopy was used to study defects created during the ion implantation and...
Concerted experiments and theoretical analysis are applied to conclusively demonstrate the vacancy g...
The impact of the amorphous silicon properties, i.e., the microstructure parameter R* and the medium...
We propose a microscopic model of the amorphization of silicon such as that resulting from ion impla...
Defects play a crucial role in determining the properties of many materials of scientific and techno...
The formation of amorphous silicon in crystalline silicon by bombardment with light (Si) and heavy (...
The transformation of silicon to the amorphous state by implanted ions was studied both experimental...
In situ transmission electron microscopy has been used to observe the production and annealing of in...
Nucleation of an amorphous Si layer is shown to occur preferentially at a thin band of dislocations ...
At present, the accumulation of structural defects and the processes of transition of crystalline si...
Amorphization has been studied in electron- (e/sup -/) and ion-irradiated Si. Si irradiated at <10 K...
Using molecular dynamics (MD) simulation, the authors investigate the mechanical response of silicon...
New empirical equations describing the rate of ion-induced crystallization at a Si crystal/amorphous...
Different amorphous structures have been induced in monocrystalline silicon by high pressure in inde...
Transmission electron microscopy (TEM) has been used to investigate thedamage produced following hig...
Positron annihilation spectroscopy was used to study defects created during the ion implantation and...
Concerted experiments and theoretical analysis are applied to conclusively demonstrate the vacancy g...
The impact of the amorphous silicon properties, i.e., the microstructure parameter R* and the medium...
We propose a microscopic model of the amorphization of silicon such as that resulting from ion impla...
Defects play a crucial role in determining the properties of many materials of scientific and techno...
The formation of amorphous silicon in crystalline silicon by bombardment with light (Si) and heavy (...
The transformation of silicon to the amorphous state by implanted ions was studied both experimental...
In situ transmission electron microscopy has been used to observe the production and annealing of in...
Nucleation of an amorphous Si layer is shown to occur preferentially at a thin band of dislocations ...
At present, the accumulation of structural defects and the processes of transition of crystalline si...
Amorphization has been studied in electron- (e/sup -/) and ion-irradiated Si. Si irradiated at <10 K...
Using molecular dynamics (MD) simulation, the authors investigate the mechanical response of silicon...
New empirical equations describing the rate of ion-induced crystallization at a Si crystal/amorphous...
Different amorphous structures have been induced in monocrystalline silicon by high pressure in inde...
Transmission electron microscopy (TEM) has been used to investigate thedamage produced following hig...
Positron annihilation spectroscopy was used to study defects created during the ion implantation and...
Concerted experiments and theoretical analysis are applied to conclusively demonstrate the vacancy g...
The impact of the amorphous silicon properties, i.e., the microstructure parameter R* and the medium...