Interferences were observed in the photoreflectance spectra of homoepitaxial layers grown on semi‐insulating GaAs and InP substrates. The modulation mechanism responsible for the interference effect was studied from the frequency and temperature dependence of the interference amplitude and the effect of continuous wave illumination. The results are in agreement with the model that the modulation is due to electrons drifting to the interface from the surface. A simple model was used to fit the interference spectra to the Lorentzian wave forms from the substrate and the epitaxial layer.Peer reviewe
Cataloged from PDF version of article.We report InSb-based high-speed photodetectors grown on GaAs s...
Low-temperature reflectance spectra of a series of Si-doped GaN epilayers with different doping conc...
Copyright 1999 American Vacuum Society. Link to the original site http://scitation.aip.org/content/a...
Interferences were observed in the photoreflectance spectra of homoepitaxial layers grown on semi‐in...
Thesis (B.S.) in Chemical Engineering -- University of Illinois at Urbana-Champaign, 1990.Includes b...
We report the observation of oscillating features in differential reflectance spectra from the GaAs ...
Contactless electroreflectance (CER) and photoreflectance (PR) measurements have been performed on s...
An epitaxial method for in situpassivation of epitaxial Al x Ga1−x As/GaAs surfaces is reported. The...
The achievement of high electrical performance InAlAs/InGaAs high-electron-mobility transistors (HEM...
The optical properties of the in situepitaxialGaN and InP passivated InGaAs∕GaAs near-surface quantu...
Thesis (B.S.) in Chemical Engineering -- University of Illinois at Urbana-Champaign, 1989.Includes b...
The paper presents room temperature photoreflectance measurements carried out on the Au/ultrathin Si...
Room temperature photoreflectance (PR) is shown to be influenced by optical interference between Si/...
Oscillatory behavior of photoemission intensity with incident photon energy has been observed for se...
We have studied the photoreflectance (PR) spectra from a MBE grown heterostructure consisting of 200...
Cataloged from PDF version of article.We report InSb-based high-speed photodetectors grown on GaAs s...
Low-temperature reflectance spectra of a series of Si-doped GaN epilayers with different doping conc...
Copyright 1999 American Vacuum Society. Link to the original site http://scitation.aip.org/content/a...
Interferences were observed in the photoreflectance spectra of homoepitaxial layers grown on semi‐in...
Thesis (B.S.) in Chemical Engineering -- University of Illinois at Urbana-Champaign, 1990.Includes b...
We report the observation of oscillating features in differential reflectance spectra from the GaAs ...
Contactless electroreflectance (CER) and photoreflectance (PR) measurements have been performed on s...
An epitaxial method for in situpassivation of epitaxial Al x Ga1−x As/GaAs surfaces is reported. The...
The achievement of high electrical performance InAlAs/InGaAs high-electron-mobility transistors (HEM...
The optical properties of the in situepitaxialGaN and InP passivated InGaAs∕GaAs near-surface quantu...
Thesis (B.S.) in Chemical Engineering -- University of Illinois at Urbana-Champaign, 1989.Includes b...
The paper presents room temperature photoreflectance measurements carried out on the Au/ultrathin Si...
Room temperature photoreflectance (PR) is shown to be influenced by optical interference between Si/...
Oscillatory behavior of photoemission intensity with incident photon energy has been observed for se...
We have studied the photoreflectance (PR) spectra from a MBE grown heterostructure consisting of 200...
Cataloged from PDF version of article.We report InSb-based high-speed photodetectors grown on GaAs s...
Low-temperature reflectance spectra of a series of Si-doped GaN epilayers with different doping conc...
Copyright 1999 American Vacuum Society. Link to the original site http://scitation.aip.org/content/a...