Analyzing Test-As-You-Fly Single Event Upset (SEU) Responses using SEU Data, Classical Reliability Models, and Space Environment Data

Complex Parts, Complex Data: Why You Need to Understand What Radiation Single Event Testing Data Does and Doesn't Show and the Implications Thereof

LaBel, Kenneth A.
Berg, Melanie D.

March 2015

Electronic parts (integrated circuits) have grown in complexity such that determining all failure mo...

Improving Single Event Effects Testing Through Software

Banker, M. W.

August 2011

Radiation encountered in space environments can be damaging to microelectronics and potentially caus...

NASA Electronic Parts and Packaging Field Programmable Gate Array Single Event Effects Test Guideline Update

Berg, Melanie D.
LaBel, Kenneth A.

March 2018

The following are updated or new subjects added to the FPGA SEE Test Guidelines manual: academic ver...

Characterization of System on a Chip (SoC) Single Event Upset (SEU) Responses Using SEU Data, Classical Reliability Models, and Space Environment Data

Berg, Melanie
Xapsos, Michael
Label, Kenneth
Campola, Michael

May 2017

We propose a method for the application of single event upset (SEU) data towards the analysis of com...

Incorporating Probability Models of Complex Test Structures to Perform Technology Independent FPGA Single Event Upset Analysis

Friendlich, M. A.
Seidlick, C. M.
Berg, M. D.
LaBel, K. A.
Kim, H. S.
Perez, C. E.

July 2011

We present SEU test and analysis of the Microsemi ProASIC3 FPGA. SEU Probability models are incorpor...

SEU System Analysis: Not Just the Sum of All Parts

Berg, Melanie D.
Label, Kenneth

May 2014

Single event upset (SEU) analysis of complex systems is challenging. Currently, system SEU analysis ...

Evaluation of System Reliability and Heavy Ion Angular Effects

Berg, Melanie
Campola, Michael

February 2019

Microsemi (Microchip) RTG4 embedded triple modular redundant (TMR) phase-locked-loop (PLL) SEU data ...

NEPP Independent Single Event Upset Testing of the Microsemi RTG4: Preliminary Data

Berg, Melanie
LaBel, Kenneth
Pellish, Jonathan

June 2016

We present an independent investigation of heavy-ion single event effect data for the Microsemi RTG4...

Upper bound SEU rate for devices in an isotropic or nonisotropic flux

Edmonds, Larry D.

August 1991

A method for constructing upper bound estimates for device single event upset (SEU) rates is present...

SINGLE EVENT UPSET DETECTION IN FIELD PROGRAMMABLE GATE ARRAYS

Ambat, Shadab Gopinath

January 2008

The high-radiation environment in space can lead to anomalies in normal satellite operation. A major...

How to characterize the problem of SEU in processors & representative errors observed on flight

Velazco, Raoul
Ecoffet, R.
Faure, F.

January 2005

In this paper are first summarized representative examples of anomalies observed in systems operatin...

Modeling and experimental verification of single event upsets

Attia, J. O.
Fogarty, T. N.
Tang, T. S.
Lindner, J. S.
Kumar, A. A.

December 1993

The research performed and the results obtained at the Laboratory for Radiation Studies, Prairie Vie...

Cosmic ray simulation and testing program

Kolasinski, W. A.
King, C. G.
Koga, R.
Imamoto, S. I.

April 1985

Single event upset (SEU) and latchup vulnerabilities were determined for a number of parts of intere...

NEPP Update of Independent Single Event Upset Field Programmable Gate Array Testing

Campola, Michael
Label, Kenneth
Berg, Melanie
Pellish, Jonathan

June 2017

This presentation provides a NASA Electronic Parts and Packaging (NEPP) Program update of independen...

Field Programmable Gate Aray (FPGA) Radiation Data: All Data is Not Equal

Berg, Melanie D.
Label, Kenneth A.

August 2016

Electronic parts (integrated circuits) have grown in complexity such that determining all failure mo...

Complex Parts, Complex Data: Why You Need to Understand What Radiation Single Event Testing Data Does and Doesn't Show and the Implications Thereof

LaBel, Kenneth A.
Berg, Melanie D.

March 2015

Electronic parts (integrated circuits) have grown in complexity such that determining all failure mo...

Improving Single Event Effects Testing Through Software

Banker, M. W.

August 2011

Radiation encountered in space environments can be damaging to microelectronics and potentially caus...

NASA Electronic Parts and Packaging Field Programmable Gate Array Single Event Effects Test Guideline Update

Berg, Melanie D.
LaBel, Kenneth A.

March 2018

The following are updated or new subjects added to the FPGA SEE Test Guidelines manual: academic ver...

Characterization of System on a Chip (SoC) Single Event Upset (SEU) Responses Using SEU Data, Classical Reliability Models, and Space Environment Data

Berg, Melanie
Xapsos, Michael
Label, Kenneth
Campola, Michael

May 2017

We propose a method for the application of single event upset (SEU) data towards the analysis of com...

Incorporating Probability Models of Complex Test Structures to Perform Technology Independent FPGA Single Event Upset Analysis

Friendlich, M. A.
Seidlick, C. M.
Berg, M. D.
LaBel, K. A.
Kim, H. S.
Perez, C. E.

July 2011

We present SEU test and analysis of the Microsemi ProASIC3 FPGA. SEU Probability models are incorpor...

SEU System Analysis: Not Just the Sum of All Parts

Berg, Melanie D.
Label, Kenneth

May 2014

Single event upset (SEU) analysis of complex systems is challenging. Currently, system SEU analysis ...

Evaluation of System Reliability and Heavy Ion Angular Effects

Berg, Melanie
Campola, Michael

February 2019

Microsemi (Microchip) RTG4 embedded triple modular redundant (TMR) phase-locked-loop (PLL) SEU data ...

NEPP Independent Single Event Upset Testing of the Microsemi RTG4: Preliminary Data

Berg, Melanie
LaBel, Kenneth
Pellish, Jonathan

June 2016

We present an independent investigation of heavy-ion single event effect data for the Microsemi RTG4...

Upper bound SEU rate for devices in an isotropic or nonisotropic flux

Edmonds, Larry D.

August 1991

A method for constructing upper bound estimates for device single event upset (SEU) rates is present...

SINGLE EVENT UPSET DETECTION IN FIELD PROGRAMMABLE GATE ARRAYS

Ambat, Shadab Gopinath

January 2008

The high-radiation environment in space can lead to anomalies in normal satellite operation. A major...

How to characterize the problem of SEU in processors & representative errors observed on flight

Velazco, Raoul
Ecoffet, R.
Faure, F.

January 2005

In this paper are first summarized representative examples of anomalies observed in systems operatin...

Modeling and experimental verification of single event upsets

Attia, J. O.
Fogarty, T. N.
Tang, T. S.
Lindner, J. S.
Kumar, A. A.

December 1993

The research performed and the results obtained at the Laboratory for Radiation Studies, Prairie Vie...

Cosmic ray simulation and testing program

Kolasinski, W. A.
King, C. G.
Koga, R.
Imamoto, S. I.

April 1985

Single event upset (SEU) and latchup vulnerabilities were determined for a number of parts of intere...

NEPP Update of Independent Single Event Upset Field Programmable Gate Array Testing

Campola, Michael
Label, Kenneth
Berg, Melanie
Pellish, Jonathan

June 2017

This presentation provides a NASA Electronic Parts and Packaging (NEPP) Program update of independen...

Field Programmable Gate Aray (FPGA) Radiation Data: All Data is Not Equal

Berg, Melanie D.
Label, Kenneth A.

August 2016

Electronic parts (integrated circuits) have grown in complexity such that determining all failure mo...

Complex Parts, Complex Data: Why You Need to Understand What Radiation Single Event Testing Data Does and Doesn't Show and the Implications Thereof

LaBel, Kenneth A.
Berg, Melanie D.

March 2015

Electronic parts (integrated circuits) have grown in complexity such that determining all failure mo...

Improving Single Event Effects Testing Through Software

Banker, M. W.

August 2011

Radiation encountered in space environments can be damaging to microelectronics and potentially caus...

NASA Electronic Parts and Packaging Field Programmable Gate Array Single Event Effects Test Guideline Update

Berg, Melanie D.
LaBel, Kenneth A.

March 2018

The following are updated or new subjects added to the FPGA SEE Test Guidelines manual: academic ver...

Analyzing Test-As-You-Fly Single Event Upset (SEU) Responses using SEU Data, Classical Reliability Models, and Space Environment Data

Abstract

Extracted data

Analyzing Test-As-You-Fly Single Event Upset (SEU) Responses using SEU Data, Classical Reliability Models, and Space Environment Data

Abstract

Extracted data

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