Total Ionizing Dose Test Report for the MB85AS4MT ReRAM

Compendium of Current Total Ionizing Dose and Displacement Damage Results from NASA Goddard Space Flight Center and Selected NASA Electronic Parts and Packaging Program

Topper, Alyson D.
Ladbury, Raymond L.
Casey, Megan C.
Campola, Michael J.
Mondy, Timothy K.
Xapsos, Michael A.
Yau, Ka-Yen
LaBel, Kenneth A.
Lauenstein, Jean-Marie
Cochran, Donna J.
O'Bryan, Martha V.
Pellish, Jonathan A.
Chen, Dakai
Wilcox, Edward P.

July 2017

Total ionizing dose and displacement damage testing was performed to characterize and determine the ...

Evaluation of High Performance Converters Under Low Dose Rate Total Ionizing Dose (TID) Testing for NASA Programs

Sahu, Kusum
Sharma, Ashok K.

January 1998

This paper reports the results of low dose rate (0.01-0.18 rads(Si)/sec) total ionizing dose (TID) t...

Design and qualification of the SEU/TD Radiation Monitor chip

Hicks, Kenneth A.
Buehler, Martin G.
Soli, George A.
Zamani, Nasser
Blaes, Brent R.

October 1992

This report describes the design, fabrication, and testing of the Single-Event Upset/Total Dose (SEU...

Micron MT29F128G08AJAAA 128GB Asynchronous Flash Memory Total Ionizing Dose Characterization Test Report

Wyrwas, Edward
Campola, Michael

April 2017

The purpose of this test was to characterize the Micron MT29F128G08AJAAAs parameter degradation for ...

Single-Event Effect Response of a Commercial ReRAM

Wilcox, Edward
Kim, Hak
Roche, Nicolas
Label, Kenneth A.
Phan, Anthony
Khachatrian, Ani
Buchner, Stephen
Chen, Dakai

May 2014

We show heavy ion test results of a commercial production-level ReRAM. The memory array is robust to...

Total Ionizing Dose Test Report for the UC1823A Pulse Width Modulator

Chen, Dakai
Forney, James

March 2017

The purpose of this study is to examine the total ionizing dose susceptibility for the UC1823A pulse...

Compendium of Current Total Ionizing Dose and Displacement Damage Results from NASA GSFC and NEPP

Cochran, Donna J.
Campola, Michael J.
Topper, Alyson D.
Chen, Dakai
Yau, Ka-Yen
Label, Kenneth A.
O'Bryan, Martha V.
Casey, Megan C.

July 2017

Total ionizing dose and displacement damage testing was performed to characterize and determine the ...

NASA Goddard Space Flight Center's Compendium of Recent Total Ionizing Dose and Displacement Damage Dose Results

LaBel, Kenneth A.
Casey, Megan C.
Topper, Alyson D.
Cochran, Donna J.
Campola, Michael J.
O'Bryan, Martha V.
Wilcox, Edward P.
Burton, Noah D.

July 2018

Total ionizing dose and displacement damage dose testing were performed to characterize and determin...

LTC1877 High Efficiency Regulator Total Ionizing Dose Test Report

Oldham, Timothy
Boutte, Alvin
Pellish, Jonathan

April 2012

This report presents total ionizing dose evaluation data for the Linear Technology Corporation LTC18...

ISSI IS46DR16640B-25DBA25 DDR2 SDRAM Total Ionizing Dose Characterization Test Report

Campola, Michael J.
Kim, Hak S.
Wyrwas, Edward J.

March 2019

The purpose of this testing is to characterize the ISSI IS46DR16640B-25DBA25 parameter degradation f...

Heavy Ion Test Report for the AD9364 RF Transceiver

Chen, Dakai
Phan, Anthony
Mondy, Tim

The purpose of this test is to determine the heavy ion-induced single-event effect (SEE) susceptibil...

Single-Event Effect Performance of a Commercial ReRAM

Kim, Hak S.
Khachatrian, Ani
Phan, Anthony
Roche, Nicolas
Chen, Dakai
LaBel, Kenneth
Buchner, Stephen
Wilcox, Edward

July 2014

We show heavy ion test results of a commercial production-level ReRAM. The memory array is robust to...

Compendium of Current Total Ionizing Dose and Displacement Damage for Candidate Spacecraft Electronics for NASA

Boutte, Alvin J.
Gigliuto, Robert A.
LaBel, Kenneth A.
Violette, Daniel
Casey, Megan C.
Ladbury, Raymond L.
Pellish, Jonathan A.
Chen, Dakai
Xapsos, Michael A.
Campola, Michael J.
Wilcox, Edward P.
Lauenstein, Jean-Marie
O'Bryan, Martha V.
Cochran, Donna J.

July 2015

Total ionizing dose and displacement damage testing is performed to characterize and determine the f...

Recent Total Ionizing Dose and Displacement Damage Compendium of Candidate Electronics for NASA Space Systems

Boutte, Alvin J.
Carts, Martin A.
Ladbury, Raymond L.
Sanders, Anthony B.
LaBel, Kenneth A.
Marshall, Cheryl J.
O'Bryan, Martha V.
Casey, Megan C.
Chen, Dakai
Xapsos, Michael A.
Lauenstein, Jean-Marie
Oldham, Timothy R.
Campola, Michael J.
Cochran, Donna J.
Pellish, Jonathan A.

July 2011

Vulnerability of a variety of candidate spacecraft electronics to total ionizing dose and displaceme...

Compendium of Current Total Ionizing Dose and Displacement Damage Results from NASA Goddard Space Flight Center and NASA Electronic Parts and Packaging Program

Cochran, Donna J.
Campola, Michael J.
Wilcox, Edward P.
Casey, Megan C.
Label, Kenneth A.
Pellish, Jonathan A.
Yau, Ka-Yen
Mondy, Timothy K.
Xapsos, Michael A.
Chen, Dakai
Wyrwas, Edward
O'Bryan, Martha V.
Ladbury, Raymond L.
Topper, Alyson D.

July 2017

Total ionizing dose and displacement damage testing was performed to characterize and determine the ...

Compendium of Current Total Ionizing Dose and Displacement Damage Results from NASA Goddard Space Flight Center and Selected NASA Electronic Parts and Packaging Program

Topper, Alyson D.
Ladbury, Raymond L.
Casey, Megan C.
Campola, Michael J.
Mondy, Timothy K.
Xapsos, Michael A.
Yau, Ka-Yen
LaBel, Kenneth A.
Lauenstein, Jean-Marie
Cochran, Donna J.
O'Bryan, Martha V.
Pellish, Jonathan A.
Chen, Dakai
Wilcox, Edward P.

July 2017

Total ionizing dose and displacement damage testing was performed to characterize and determine the ...

Evaluation of High Performance Converters Under Low Dose Rate Total Ionizing Dose (TID) Testing for NASA Programs

Sahu, Kusum
Sharma, Ashok K.

January 1998

This paper reports the results of low dose rate (0.01-0.18 rads(Si)/sec) total ionizing dose (TID) t...

Design and qualification of the SEU/TD Radiation Monitor chip

Hicks, Kenneth A.
Buehler, Martin G.
Soli, George A.
Zamani, Nasser
Blaes, Brent R.

October 1992

This report describes the design, fabrication, and testing of the Single-Event Upset/Total Dose (SEU...

Micron MT29F128G08AJAAA 128GB Asynchronous Flash Memory Total Ionizing Dose Characterization Test Report

Wyrwas, Edward
Campola, Michael

April 2017

The purpose of this test was to characterize the Micron MT29F128G08AJAAAs parameter degradation for ...

Single-Event Effect Response of a Commercial ReRAM

Wilcox, Edward
Kim, Hak
Roche, Nicolas
Label, Kenneth A.
Phan, Anthony
Khachatrian, Ani
Buchner, Stephen
Chen, Dakai

May 2014

We show heavy ion test results of a commercial production-level ReRAM. The memory array is robust to...

Total Ionizing Dose Test Report for the UC1823A Pulse Width Modulator

Chen, Dakai
Forney, James

March 2017

The purpose of this study is to examine the total ionizing dose susceptibility for the UC1823A pulse...

Compendium of Current Total Ionizing Dose and Displacement Damage Results from NASA GSFC and NEPP

Cochran, Donna J.
Campola, Michael J.
Topper, Alyson D.
Chen, Dakai
Yau, Ka-Yen
Label, Kenneth A.
O'Bryan, Martha V.
Casey, Megan C.

July 2017

Total ionizing dose and displacement damage testing was performed to characterize and determine the ...

NASA Goddard Space Flight Center's Compendium of Recent Total Ionizing Dose and Displacement Damage Dose Results

LaBel, Kenneth A.
Casey, Megan C.
Topper, Alyson D.
Cochran, Donna J.
Campola, Michael J.
O'Bryan, Martha V.
Wilcox, Edward P.
Burton, Noah D.

July 2018

Total ionizing dose and displacement damage dose testing were performed to characterize and determin...

LTC1877 High Efficiency Regulator Total Ionizing Dose Test Report

Oldham, Timothy
Boutte, Alvin
Pellish, Jonathan

April 2012

This report presents total ionizing dose evaluation data for the Linear Technology Corporation LTC18...

ISSI IS46DR16640B-25DBA25 DDR2 SDRAM Total Ionizing Dose Characterization Test Report

Campola, Michael J.
Kim, Hak S.
Wyrwas, Edward J.

March 2019

The purpose of this testing is to characterize the ISSI IS46DR16640B-25DBA25 parameter degradation f...

Heavy Ion Test Report for the AD9364 RF Transceiver

Chen, Dakai
Phan, Anthony
Mondy, Tim

The purpose of this test is to determine the heavy ion-induced single-event effect (SEE) susceptibil...

Single-Event Effect Performance of a Commercial ReRAM

Kim, Hak S.
Khachatrian, Ani
Phan, Anthony
Roche, Nicolas
Chen, Dakai
LaBel, Kenneth
Buchner, Stephen
Wilcox, Edward

July 2014

We show heavy ion test results of a commercial production-level ReRAM. The memory array is robust to...

Compendium of Current Total Ionizing Dose and Displacement Damage for Candidate Spacecraft Electronics for NASA

Boutte, Alvin J.
Gigliuto, Robert A.
LaBel, Kenneth A.
Violette, Daniel
Casey, Megan C.
Ladbury, Raymond L.
Pellish, Jonathan A.
Chen, Dakai
Xapsos, Michael A.
Campola, Michael J.
Wilcox, Edward P.
Lauenstein, Jean-Marie
O'Bryan, Martha V.
Cochran, Donna J.

July 2015

Total ionizing dose and displacement damage testing is performed to characterize and determine the f...

Recent Total Ionizing Dose and Displacement Damage Compendium of Candidate Electronics for NASA Space Systems

Boutte, Alvin J.
Carts, Martin A.
Ladbury, Raymond L.
Sanders, Anthony B.
LaBel, Kenneth A.
Marshall, Cheryl J.
O'Bryan, Martha V.
Casey, Megan C.
Chen, Dakai
Xapsos, Michael A.
Lauenstein, Jean-Marie
Oldham, Timothy R.
Campola, Michael J.
Cochran, Donna J.
Pellish, Jonathan A.

July 2011

Vulnerability of a variety of candidate spacecraft electronics to total ionizing dose and displaceme...

Compendium of Current Total Ionizing Dose and Displacement Damage Results from NASA Goddard Space Flight Center and NASA Electronic Parts and Packaging Program

Cochran, Donna J.
Campola, Michael J.
Wilcox, Edward P.
Casey, Megan C.
Label, Kenneth A.
Pellish, Jonathan A.
Yau, Ka-Yen
Mondy, Timothy K.
Xapsos, Michael A.
Chen, Dakai
Wyrwas, Edward
O'Bryan, Martha V.
Ladbury, Raymond L.
Topper, Alyson D.

July 2017

Total ionizing dose and displacement damage testing was performed to characterize and determine the ...

Compendium of Current Total Ionizing Dose and Displacement Damage Results from NASA Goddard Space Flight Center and Selected NASA Electronic Parts and Packaging Program

Topper, Alyson D.
Ladbury, Raymond L.
Casey, Megan C.
Campola, Michael J.
Mondy, Timothy K.
Xapsos, Michael A.
Yau, Ka-Yen
LaBel, Kenneth A.
Lauenstein, Jean-Marie
Cochran, Donna J.
O'Bryan, Martha V.
Pellish, Jonathan A.
Chen, Dakai
Wilcox, Edward P.

July 2017

Total ionizing dose and displacement damage testing was performed to characterize and determine the ...

Evaluation of High Performance Converters Under Low Dose Rate Total Ionizing Dose (TID) Testing for NASA Programs

Sahu, Kusum
Sharma, Ashok K.

January 1998

This paper reports the results of low dose rate (0.01-0.18 rads(Si)/sec) total ionizing dose (TID) t...

Design and qualification of the SEU/TD Radiation Monitor chip

Hicks, Kenneth A.
Buehler, Martin G.
Soli, George A.
Zamani, Nasser
Blaes, Brent R.

October 1992

This report describes the design, fabrication, and testing of the Single-Event Upset/Total Dose (SEU...

Total Ionizing Dose Test Report for the MB85AS4MT ReRAM

Abstract

Extracted data

Total Ionizing Dose Test Report for the MB85AS4MT ReRAM

Abstract

Extracted data

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