In GaAs-based light-emitting diode (LED) or laser diode (LD), the forward voltage (V) will decrease linearly with the increasing junction temperature (T). This can be used as a convenient method to measure the junction temperature. In GaN-based LED, the relationship is linear too. But in GaN-based LD, the acceptor M (g) in p-GaN material can not ionize completely at-room temperature, and the carrier density will change with temperature. But we find finally that, this change won't lead to a nonlinear relationship of V-T. Our experiments show that it is Linear too
Theories of spontaneous emission rates and carrier recombination mechanisms for multiple-quantum-wel...
Temperature-dependent ac current-voltage-capacitance characteristics between 90 K and 440 K were inv...
Given the temperature dependence of various aspects of light-emitting diode (LED) performance, LED t...
<div class="aip-paragraph">An expression of the relation between junction temperature and forward vo...
The junction temperature and thermal resistance of AlGaN and GaInN ultraviolet (UV) light-emitting d...
Optical and electrical characteristics of power light-emitting diodes (LEDs) are strongly dependent ...
Saturation of the junction voltage in GaN-based laser diodes (LDs) is studied. It is found that ther...
This paper shows that the junction temperature and input and output power of light-emitting diodes (...
Rise of junction temperature during operation can greatly affect performance and reliability of Ligh...
A study on power light-emitting diode (LED) junction temperature sensing based on the measurements o...
Temperature-dependent ac current-voltage-capacitance characteristics between 90 K and 440 K were inv...
Estimating the junction temperature and its dynamic behavior in dependence of various operating cond...
In this paper, high power flip-chip GaN-based LEDs were fabricated, and then the effects of junction...
We presented the analysis of the incomplete conduction in bonding medium in high power GaN-based lig...
Two kinds of InGaN-based light-emitting diodes (LEDs) are investigated to understand the nonradiativ...
Theories of spontaneous emission rates and carrier recombination mechanisms for multiple-quantum-wel...
Temperature-dependent ac current-voltage-capacitance characteristics between 90 K and 440 K were inv...
Given the temperature dependence of various aspects of light-emitting diode (LED) performance, LED t...
<div class="aip-paragraph">An expression of the relation between junction temperature and forward vo...
The junction temperature and thermal resistance of AlGaN and GaInN ultraviolet (UV) light-emitting d...
Optical and electrical characteristics of power light-emitting diodes (LEDs) are strongly dependent ...
Saturation of the junction voltage in GaN-based laser diodes (LDs) is studied. It is found that ther...
This paper shows that the junction temperature and input and output power of light-emitting diodes (...
Rise of junction temperature during operation can greatly affect performance and reliability of Ligh...
A study on power light-emitting diode (LED) junction temperature sensing based on the measurements o...
Temperature-dependent ac current-voltage-capacitance characteristics between 90 K and 440 K were inv...
Estimating the junction temperature and its dynamic behavior in dependence of various operating cond...
In this paper, high power flip-chip GaN-based LEDs were fabricated, and then the effects of junction...
We presented the analysis of the incomplete conduction in bonding medium in high power GaN-based lig...
Two kinds of InGaN-based light-emitting diodes (LEDs) are investigated to understand the nonradiativ...
Theories of spontaneous emission rates and carrier recombination mechanisms for multiple-quantum-wel...
Temperature-dependent ac current-voltage-capacitance characteristics between 90 K and 440 K were inv...
Given the temperature dependence of various aspects of light-emitting diode (LED) performance, LED t...