International audienceOn-board space systems are exposed to harsh environmental conditions includingradiations, extreme temperatures and high-vacuum… Each component of thisspace environment, either separately or in synergy, induces short or long termdegradation of electronics or materials, thereby impacting reliability. The wide diversityof observed disruptions, potential anomalies (and therefore of their underlyingphysical-chemical mechanisms) and the large set of technologies involved requirethe development of modeling tools to support experimentation, in order to achieve arepresentative simulation of device response and a reliable prediction of the life, as wellas to limit ground testing
International Telemetering Conference Proceedings / October 13-15, 1981 / Bahia Hotel, San Diego, Ca...
Radiation damage effects represent one of the limits for technologies to be used in harsh radiation ...
This project is a study of the effects the radiation environment has on the electronic components in...
This paper addresses the issues involved in radiation testing of devices and subsystems to obtain th...
Trapped protons and electrons in the Earth's radiation belts and cosmic rays present significant cha...
The traditional radiation testing of space electronics has been used for more than fifty years to su...
Space radiation is significantly harmful to electronic Components. The operating time, duration and ...
Equipment has been designed and created for experimental simulation of space environment conditions ...
Radiation testing nowadays becomes more and more important even with the grown NewSpace ...
A versatile test facility has been designed to study the effects of space environment fluxes and rad...
In this paper, we discuss the diagnosis of particle-induced failures in harsh environ-ments such as ...
Effects on the internal spacecraft electronics due to exposure to the natural and enhanced space rad...
Nowadays integrated circuit reliability is challenged by both variability and working conditions. En...
The slides present a brief snapshot discussing electronics and exploration-related challenges. Radia...
In this paper, we discuss the diagnosis of particle-induced failures in harsh environments such as s...
International Telemetering Conference Proceedings / October 13-15, 1981 / Bahia Hotel, San Diego, Ca...
Radiation damage effects represent one of the limits for technologies to be used in harsh radiation ...
This project is a study of the effects the radiation environment has on the electronic components in...
This paper addresses the issues involved in radiation testing of devices and subsystems to obtain th...
Trapped protons and electrons in the Earth's radiation belts and cosmic rays present significant cha...
The traditional radiation testing of space electronics has been used for more than fifty years to su...
Space radiation is significantly harmful to electronic Components. The operating time, duration and ...
Equipment has been designed and created for experimental simulation of space environment conditions ...
Radiation testing nowadays becomes more and more important even with the grown NewSpace ...
A versatile test facility has been designed to study the effects of space environment fluxes and rad...
In this paper, we discuss the diagnosis of particle-induced failures in harsh environ-ments such as ...
Effects on the internal spacecraft electronics due to exposure to the natural and enhanced space rad...
Nowadays integrated circuit reliability is challenged by both variability and working conditions. En...
The slides present a brief snapshot discussing electronics and exploration-related challenges. Radia...
In this paper, we discuss the diagnosis of particle-induced failures in harsh environments such as s...
International Telemetering Conference Proceedings / October 13-15, 1981 / Bahia Hotel, San Diego, Ca...
Radiation damage effects represent one of the limits for technologies to be used in harsh radiation ...
This project is a study of the effects the radiation environment has on the electronic components in...