International audienceAs the feature size decrease with each process generation, and nominal SoC design size approaching millions of gates, there is a need to explore more in depth the power distribution across the IC and investigate the power planning and thermal effects on the functionality and reliability. We propose in this paper a methodology that allows computing the local power of a digital circuit mapped to the physical representation in order to analyze the power distribution. This is used as inputs to a thermal simulator for extracting the thermal maps of the chip. The power calculation cannot be done at the transistor level for multi-million transistors with large test-benches, otherwise it will need unreasonable CPU resources an...
In this paper, a method is proposed for extraction of coupled networks from layout information for s...
Abstract—Modern systems-on-a-chip are equipped with power architectures, allowing to control the con...
With the ever increasing integration density of electronic circuits and devices thermal issues due t...
Today, power consumption plays an important role in digital IC design. Demands come from the applica...
In this paper, we present a new technique to calculate the power dissipation profile from the IC tem...
Current integrated circuits exhibit an impressive and in- creasing component density, hence an alar...
International audienceModern systems-on-a-chip are equipped with power architectures, allowing to co...
Power blurring has been developed to calculate temperature profiles in VLSI ICs, in both steady-stat...
Current integrated circuits exhibit an impressive and in- creasing component density, hence an alar...
Current integrated circuits exhibit an impressive and in- creasing component density, hence an alar...
Current integrated circuits exhibit an impressive and in- creasing component density, hence an alar...
Current integrated circuits exhibit an impressive and in- creasing component density, hence an alar...
Computer-aided design (CAD) tools are frequently employed to verify the design objectives before the...
A novel approach to logical and thermal co-simulation of ASIC circuits is presented in this paper. N...
Abstract—Modern systems-on-a-chip are equipped with power architectures, allowing to control the con...
In this paper, a method is proposed for extraction of coupled networks from layout information for s...
Abstract—Modern systems-on-a-chip are equipped with power architectures, allowing to control the con...
With the ever increasing integration density of electronic circuits and devices thermal issues due t...
Today, power consumption plays an important role in digital IC design. Demands come from the applica...
In this paper, we present a new technique to calculate the power dissipation profile from the IC tem...
Current integrated circuits exhibit an impressive and in- creasing component density, hence an alar...
International audienceModern systems-on-a-chip are equipped with power architectures, allowing to co...
Power blurring has been developed to calculate temperature profiles in VLSI ICs, in both steady-stat...
Current integrated circuits exhibit an impressive and in- creasing component density, hence an alar...
Current integrated circuits exhibit an impressive and in- creasing component density, hence an alar...
Current integrated circuits exhibit an impressive and in- creasing component density, hence an alar...
Current integrated circuits exhibit an impressive and in- creasing component density, hence an alar...
Computer-aided design (CAD) tools are frequently employed to verify the design objectives before the...
A novel approach to logical and thermal co-simulation of ASIC circuits is presented in this paper. N...
Abstract—Modern systems-on-a-chip are equipped with power architectures, allowing to control the con...
In this paper, a method is proposed for extraction of coupled networks from layout information for s...
Abstract—Modern systems-on-a-chip are equipped with power architectures, allowing to control the con...
With the ever increasing integration density of electronic circuits and devices thermal issues due t...