International audienceIn this paper a multi-mode signature analyser is proposed to be built into analog and mixed-signal integrated circuits. The analyser circuitry is based on analog integrators and can perform transient (with one integrator) and frequency (with two integrators) response compaction. The area overhead incurred can be very low, since the same signature analyser can be shared by several analog macros. Besides that, whenever integrators are available on-chip for functional purposes, they can be shared with the testing circuitry. Experiments carried on a Sallen-Key (transient response compaction) and on a biquad filter (frequency response compaction) showed that a very high coverage of catastrophic and pammetric faults can be o...
An on-chip analog mixed-signal testing, compli-ant with IEEE 1149.4 standard is presented. The testi...
In this paper, we address the problem of functional testing of mixed-signal circuits using pseudo-ra...
The design of checkers aimed at the concurrent test of analog and mixed-signal circuits is considere...
International audienceIn this paper a multi-mode signature analyser is proposed to be built into ana...
Let a circuit have m outputs, m>1. There are two ways to test this circuit by means of a signature a...
A fast multiple input signature register (MISR) computation algorithm for signature simulation is pr...
A test system is considered in which the signature analyzer, i.e. the most frequently applied system...
A new test-set selection technique based on the frequency-domain testing of analog circuits is prese...
We propose an approach to design of an algebraic signature analyzer that can be used for mixed-signa...
International audienceAmong other applications, programmable oscillators are used to generate patter...
SIGLECNRS T Bordereau / INIST-CNRS - Institut de l'Information Scientifique et TechniqueFRFranc
International audienceAmong other applications, programmable oscillators are used to generate patter...
The growing need for integrable test solutions has prompted the creation of various test bus standar...
In this paper, multi-frequency test is presented, which can maximize differences between the failure...
This paper presents a new testing approach for analogue circuits based on the digital signature anal...
An on-chip analog mixed-signal testing, compli-ant with IEEE 1149.4 standard is presented. The testi...
In this paper, we address the problem of functional testing of mixed-signal circuits using pseudo-ra...
The design of checkers aimed at the concurrent test of analog and mixed-signal circuits is considere...
International audienceIn this paper a multi-mode signature analyser is proposed to be built into ana...
Let a circuit have m outputs, m>1. There are two ways to test this circuit by means of a signature a...
A fast multiple input signature register (MISR) computation algorithm for signature simulation is pr...
A test system is considered in which the signature analyzer, i.e. the most frequently applied system...
A new test-set selection technique based on the frequency-domain testing of analog circuits is prese...
We propose an approach to design of an algebraic signature analyzer that can be used for mixed-signa...
International audienceAmong other applications, programmable oscillators are used to generate patter...
SIGLECNRS T Bordereau / INIST-CNRS - Institut de l'Information Scientifique et TechniqueFRFranc
International audienceAmong other applications, programmable oscillators are used to generate patter...
The growing need for integrable test solutions has prompted the creation of various test bus standar...
In this paper, multi-frequency test is presented, which can maximize differences between the failure...
This paper presents a new testing approach for analogue circuits based on the digital signature anal...
An on-chip analog mixed-signal testing, compli-ant with IEEE 1149.4 standard is presented. The testi...
In this paper, we address the problem of functional testing of mixed-signal circuits using pseudo-ra...
The design of checkers aimed at the concurrent test of analog and mixed-signal circuits is considere...