International audienceThe widespread use of multicore processors in computing systems and the imperative necessity of exploiting massive parallelism to improve performance and dependability, make mandatory to evaluate the impact of SEUs on parallel applications running on multicore processors. This paper presents a method and preliminary results of SEU fault-injection campaigns performed on parallel applications implemented on a quad-core processor. Two representative benchmarks applications were considered for the analysis
ISBN : 978-1-4244-1665-3International audienceThis paper deals with the prediction of SEU error rate...
International audienceThe SEU fault-tolerance of a benchmark self-converging algorithm is evaluated ...
The Embedded system design is characterized by its daily complexity. It integrates a hardware and so...
International audienceThe current technological challenge for computing systems is to use multicore ...
Multicore processors are becoming more and more attractive in embedded and safety-critical domains b...
Modern processors embed features such as pipelined execution units and cache memories that can hardl...
International audienceThis paper describes two different but complementary approaches that can be us...
Abstract—An approach to study the effects of single event upsets (SEU) by fault injection performed ...
ISBN 978-1-4673-2355-0International audienceAn approach to study the effects of soft errors by fault...
International audienceSingle Event Upset (SEU) phenomena is becoming a major concern in applications...
With the scale down of transistor sizes and higher frequencies with low power modes in modern archit...
International audienceThe Embedded system design is characterized by its daily complexity. It integr...
This paper presents a detailed analysis of the behavior of a novel fault-tolerant 32-bit embedded CP...
International audienceThe single-event upset (SEU) fault tolerance of a benchmark self-converging al...
International audienceThis paper presents a new fault injection method based on the CEU (Code Emulat...
ISBN : 978-1-4244-1665-3International audienceThis paper deals with the prediction of SEU error rate...
International audienceThe SEU fault-tolerance of a benchmark self-converging algorithm is evaluated ...
The Embedded system design is characterized by its daily complexity. It integrates a hardware and so...
International audienceThe current technological challenge for computing systems is to use multicore ...
Multicore processors are becoming more and more attractive in embedded and safety-critical domains b...
Modern processors embed features such as pipelined execution units and cache memories that can hardl...
International audienceThis paper describes two different but complementary approaches that can be us...
Abstract—An approach to study the effects of single event upsets (SEU) by fault injection performed ...
ISBN 978-1-4673-2355-0International audienceAn approach to study the effects of soft errors by fault...
International audienceSingle Event Upset (SEU) phenomena is becoming a major concern in applications...
With the scale down of transistor sizes and higher frequencies with low power modes in modern archit...
International audienceThe Embedded system design is characterized by its daily complexity. It integr...
This paper presents a detailed analysis of the behavior of a novel fault-tolerant 32-bit embedded CP...
International audienceThe single-event upset (SEU) fault tolerance of a benchmark self-converging al...
International audienceThis paper presents a new fault injection method based on the CEU (Code Emulat...
ISBN : 978-1-4244-1665-3International audienceThis paper deals with the prediction of SEU error rate...
International audienceThe SEU fault-tolerance of a benchmark self-converging algorithm is evaluated ...
The Embedded system design is characterized by its daily complexity. It integrates a hardware and so...