A Bulk Built-in Sensor for Detection of Fault Attacks
- Possamai Bastos, Rodrigo
- Sill Torres, Franck
- Dutertre, Jean Max
- Flottes, Marie-Lise
- Di Natale, Giorgio
- Rouzeyre, Bruno
Publication date
June 2013
DOI Publisher
Institute of Electrical and Electronics Engineers (IEEE)Abstract
International audienceThis work presents a novel scheme of built-in current sensor (BICS) for detecting transient fault-based attacks of short and long duration as well as from different simultaneous sources. The new sensor is a single mechanism connected to PMOS and NMOS bulks of the monitored logic. The proposed protection strategy is also useful for improving any state-of-the-art Bulk-BICS from pairs of PMOS and NMOS sensors to single sensors
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