Add to ORKGSRAM-FPGA systems are simulated with a model based on the Stochastic Activity Networks (SAN) formalism. Faults are injected into the model and their propagation is traced to the output pins using a four-valued logic that enables faulty logical signals to be tagged and recognized without recurring to a comparison with the expected output values. Input vectors are generated probabilistically based on assumed signal probabilities. By this procedure it is possible to obtain a statistical assessment of the observability of different faults for the generated inputs. The analysis of a 2-out-of-2 voter is shown as a case study
SRAM-based field programmable gate arrays (FPGAs) are particularly sensitive to single ev...
Today's nano-scale technology nodes are bringing reliability concerns back to the center stage of di...
Predicting soft errors on SRAM-based FPGAs without a wasteful time-consuming or a high-cost has alwa...
We describe a simulation-based fault injection technique for failure probability and fault observabi...
We describe a simulation-based fault injection technique for calculating the probability of failures...
Abstract—We describe a model of FPGA based systems re-alised with the Stochastic Activity Networks (...
We describe a model of Field Programmable Gate Array based systems realised with the Stochastic Acti...
Various formal approaches can be used to study FPGA-based systems in relationships to faults, in par...
Various formal approaches can be used to study FPGA-based systems in relationships to faults, in par...
In this paper a simulator of soft errors (SEUs) in the configuration memory of SRAM-based FPGAs is p...
Abstract—Effects of radiation on electronic circuits used in extra-terrestrial applications and radi...
International audienceFault injection tools, which include fault simulation and emulation, are a wel...
In this paper a simulator of soft errors (SEUs) in the configuration memory of SRAM-based FPGAs is p...
The SRAM cells that form the configuration memory of an SRAM-based FPGA make such FPGAs particularly...
In this paper, we present an automated test frame-work for the characterization of stochastic behavi...
SRAM-based field programmable gate arrays (FPGAs) are particularly sensitive to single ev...
Today's nano-scale technology nodes are bringing reliability concerns back to the center stage of di...
Predicting soft errors on SRAM-based FPGAs without a wasteful time-consuming or a high-cost has alwa...
We describe a simulation-based fault injection technique for failure probability and fault observabi...
We describe a simulation-based fault injection technique for calculating the probability of failures...
Abstract—We describe a model of FPGA based systems re-alised with the Stochastic Activity Networks (...
We describe a model of Field Programmable Gate Array based systems realised with the Stochastic Acti...
Various formal approaches can be used to study FPGA-based systems in relationships to faults, in par...
Various formal approaches can be used to study FPGA-based systems in relationships to faults, in par...
In this paper a simulator of soft errors (SEUs) in the configuration memory of SRAM-based FPGAs is p...
Abstract—Effects of radiation on electronic circuits used in extra-terrestrial applications and radi...
International audienceFault injection tools, which include fault simulation and emulation, are a wel...
In this paper a simulator of soft errors (SEUs) in the configuration memory of SRAM-based FPGAs is p...
The SRAM cells that form the configuration memory of an SRAM-based FPGA make such FPGAs particularly...
In this paper, we present an automated test frame-work for the characterization of stochastic behavi...
SRAM-based field programmable gate arrays (FPGAs) are particularly sensitive to single ev...
Today's nano-scale technology nodes are bringing reliability concerns back to the center stage of di...
Predicting soft errors on SRAM-based FPGAs without a wasteful time-consuming or a high-cost has alwa...