Scanning electrooptic microscopy of the relaxor materials

Scanning electrooptic microscopy provides optical imaging of surface ferroelectric polarization patterns by measuring modulation of the output optical signal induced by a sinusoidal electric field. Ferroelectric single crystals and inhomogeneous phase transitions in ferroelectric thin films were investigated by this technique. Here we report investigation of the domain structure in relaxor materials. We have observed formation and evolution of microscopic domains under the action of a dc bias electric field. Furthermore, the local electrooptic switching loops have been measured with sub-micron resolution. Features of electrooptic imaging in ceramic samples are also discussed