Reliability andSEE mitigation in memories for space applications
- Petritoli, Enrico
- Leccese, Fabio
Publication date
January 2016
DOI Publisher
Institute of Electrical and Electronics Engineers (IEEE)Abstract
The paper shows the strategies of choice of recovery methods of the RAM when, in space environment, they are affected by various SEE phenomena. The article considers various recovery methodologies, including two scrubbing methods (deterministic and probabilistic) and the criteria of choice according to the kind of mission in which the component is involved
Add to ORKG