We present a cross-section scanning tunneling microscopy (STM), scanning tunneling spectroscopy (STS) and ab initio density-functional theory simulations study of the cleaved nonpolar (1[overline 1]00) surface (m-plane) of n-type HVPE GaN free-standing quasisubstrates. Atomically resolved empty and filled states STM topographies show that no reconstruction occurs upon cleavage, as predicted by theory. STS measurements on clean and atomically flat cleaved surfaces (defect concentration sigmad=3×10**13 cm−2, the Fermi energy is pinned inside the band gap in defect-derived surface states and tunneling through filled (empty) N-like (Ga-like) states takes place.We present a cross-section scanning tunneling microscopy (STM), scanning tunneling s...
Intrinsic and extrinsic pinning and passivation ofm-plane cleavage facets of GaNn-p-n junctions were...
Using band structure and total energy methods, we study the atomic and electronic structures of the ...
Optoelectronic devices based on gallium nitride (GaN) and indium gallium nitride (InGaN) are in the ...
We present a cross-section scanning tunneling microscopy (STM), scanning tunneling spectroscopy (STS...
We present a cross-section scanning tunneling microscopy (STM), scanning tunneling spectroscopy (STS...
GaN(11¯00) cleavage surfaces were investigated by cross-sectional scanning tunneling microscopy and ...
We investigated the origins of the tunnel current in scanning tunneling microscopy (STM) and spectro...
Optoelectronic devices based on gallium nitride (GaN) and indium gallium nitride (InGaN) are in the ...
GaN1000 cleavage surfaces were investigated by cross-sectional scanning tunneling microscopy and spe...
The electron affinity and surface states are of utmost importance for designing the potential landsc...
We present density-functional theory studies for a variety of surfaces and extended defects in GaN. ...
We present density-functional theory studies for a variety of surfaces and extended defects in GaN. ...
We investigate the electronic structure of the GaN (10 1 ̄ 0) prototype surface for GaN nanowire sid...
The results of a study of the surface relaxation of GaN in the framework of the ab initio (all-elect...
A review of surface structures of bare and adsorbate-covered GaN (0001) and (0 0 0 -1) surfaces is p...
Intrinsic and extrinsic pinning and passivation ofm-plane cleavage facets of GaNn-p-n junctions were...
Using band structure and total energy methods, we study the atomic and electronic structures of the ...
Optoelectronic devices based on gallium nitride (GaN) and indium gallium nitride (InGaN) are in the ...
We present a cross-section scanning tunneling microscopy (STM), scanning tunneling spectroscopy (STS...
We present a cross-section scanning tunneling microscopy (STM), scanning tunneling spectroscopy (STS...
GaN(11¯00) cleavage surfaces were investigated by cross-sectional scanning tunneling microscopy and ...
We investigated the origins of the tunnel current in scanning tunneling microscopy (STM) and spectro...
Optoelectronic devices based on gallium nitride (GaN) and indium gallium nitride (InGaN) are in the ...
GaN1000 cleavage surfaces were investigated by cross-sectional scanning tunneling microscopy and spe...
The electron affinity and surface states are of utmost importance for designing the potential landsc...
We present density-functional theory studies for a variety of surfaces and extended defects in GaN. ...
We present density-functional theory studies for a variety of surfaces and extended defects in GaN. ...
We investigate the electronic structure of the GaN (10 1 ̄ 0) prototype surface for GaN nanowire sid...
The results of a study of the surface relaxation of GaN in the framework of the ab initio (all-elect...
A review of surface structures of bare and adsorbate-covered GaN (0001) and (0 0 0 -1) surfaces is p...
Intrinsic and extrinsic pinning and passivation ofm-plane cleavage facets of GaNn-p-n junctions were...
Using band structure and total energy methods, we study the atomic and electronic structures of the ...
Optoelectronic devices based on gallium nitride (GaN) and indium gallium nitride (InGaN) are in the ...