26th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis, Toulouse, FRANCE, OCT 05-19, 2015International audienceThis paper surveys ten years of experimentation conducted on the Altitude SEE (Single Event Effects) Test European Platform (ASTEP), a permanent mountain laboratory opened in 2005 on the Plateau de Bure (Devoluy, France) at the altitude of 2552 m and primarily dedicated to the characterization of soft errors in electronic circuits subjected to terrestrial cosmic rays. The paper retraces the foundations of the project and gives an extensive overview of the different past, current and future experiments conducted on ASTEP in the fields of SER (soft error rate) real-time testing and natural radiation ...
International audienceThis paper describes the Plateau de Bure Neutron Monitor (PdBNM), an instrumen...
International audienceIntegrated circuits are sensitive to the effects of natural radiation. This pa...
International audienceThe purpose of this paper is to discriminate between secondary atmospheric par...
International audienceThis paper surveys ten years of experimentation conducted on the Altitude SEE ...
International Conference on Integrated Circuit Design and Technology, Austin, TX, MAY 18-20, 2009Int...
9th European Workshop on Radiation and its Effects on Components and Systems, Athens, GREECE, SEP 27...
IEEE International Conference on Integrated Circuit Design and Technology, Grenoble, FRANCE, JUN 02-...
IEEE International Reliability Physics Symposium (IRPS), Anaheim, CA, APR 15-19, 2012International a...
International audienceThe real-time (or life testing) soft-error rate (SER) measurement is an experi...
21st European Symposium on the Reliability of Electron Devices, Failure Physics and Analysis (ESREF)...
IEEE International Reliability Physics Symposium (IRPS), Anaheim, CA, APR 15-19, 2012International a...
International audienceThis paper describes the Plateau de Bure Neutron Monitor (PdBNM), an instrumen...
International audienceIntegrated circuits are sensitive to the effects of natural radiation. This pa...
International audienceThe purpose of this paper is to discriminate between secondary atmospheric par...
International audienceThis paper surveys ten years of experimentation conducted on the Altitude SEE ...
International Conference on Integrated Circuit Design and Technology, Austin, TX, MAY 18-20, 2009Int...
9th European Workshop on Radiation and its Effects on Components and Systems, Athens, GREECE, SEP 27...
IEEE International Conference on Integrated Circuit Design and Technology, Grenoble, FRANCE, JUN 02-...
IEEE International Reliability Physics Symposium (IRPS), Anaheim, CA, APR 15-19, 2012International a...
International audienceThe real-time (or life testing) soft-error rate (SER) measurement is an experi...
21st European Symposium on the Reliability of Electron Devices, Failure Physics and Analysis (ESREF)...
IEEE International Reliability Physics Symposium (IRPS), Anaheim, CA, APR 15-19, 2012International a...
International audienceThis paper describes the Plateau de Bure Neutron Monitor (PdBNM), an instrumen...
International audienceIntegrated circuits are sensitive to the effects of natural radiation. This pa...
International audienceThe purpose of this paper is to discriminate between secondary atmospheric par...