IEEE International Reliability Physics Symposium (IRPS), Anaheim, CA, APR 15-19, 2012International audienceThe real-time (or life testing) soft-error rate (SER) measurement is an experimental reliability technique to determine the SER from the monitoring of a population of devices subjected to the natural radiation environment and operating under nominal conditions. This review presentation gives a survey over different real-time SER experiments conducted in altitude and/or underground over the past decade. We discuss the specific advantages and limitations of this approach as well as its comparison with accelerated tests using intense particle beams or sources
ISBN 2-84813-052-0Estimating the soft error rate (SER) of digital equipment is a major concern: whil...
International audienceThis work presents an approach to predict the error rates due to Single Event ...
International audienceThis paper surveys ten years of experimentation conducted on the Altitude SEE ...
IEEE International Reliability Physics Symposium (IRPS), Anaheim, CA, APR 15-19, 2012International a...
International audienceThe real-time (or life testing) soft-error rate (SER) measurement is an experi...
IEEE International Reliability Physics Symposium (IRPS), Anaheim, CA, APR 15-19, 2012International a...
IEEE International Conference on Integrated Circuit Design and Technology, Grenoble, FRANCE, JUN 02-...
System reliability has become a key design aspect for computer systems due to the aggressive technol...
System reliability has become a key design aspect for computer systems due to the aggressive technol...
21st European Symposium on the Reliability of Electron Devices, Failure Physics and Analysis (ESREF)...
International Conference on Integrated Circuit Design and Technology, Austin, TX, MAY 18-20, 2009Int...
26th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis, Toulouse, ...
International audienceThis paper reports five years of real-time soft error rate experimentation con...
Due to continuous CMOS technology downscaling, Integrated Circuits (ICs) have become more susceptibl...
ISBN 2-84813-052-0Estimating the soft error rate (SER) of digital equipment is a major concern: whil...
International audienceThis work presents an approach to predict the error rates due to Single Event ...
International audienceThis paper surveys ten years of experimentation conducted on the Altitude SEE ...
IEEE International Reliability Physics Symposium (IRPS), Anaheim, CA, APR 15-19, 2012International a...
International audienceThe real-time (or life testing) soft-error rate (SER) measurement is an experi...
IEEE International Reliability Physics Symposium (IRPS), Anaheim, CA, APR 15-19, 2012International a...
IEEE International Conference on Integrated Circuit Design and Technology, Grenoble, FRANCE, JUN 02-...
System reliability has become a key design aspect for computer systems due to the aggressive technol...
System reliability has become a key design aspect for computer systems due to the aggressive technol...
21st European Symposium on the Reliability of Electron Devices, Failure Physics and Analysis (ESREF)...
International Conference on Integrated Circuit Design and Technology, Austin, TX, MAY 18-20, 2009Int...
26th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis, Toulouse, ...
International audienceThis paper reports five years of real-time soft error rate experimentation con...
Due to continuous CMOS technology downscaling, Integrated Circuits (ICs) have become more susceptibl...
ISBN 2-84813-052-0Estimating the soft error rate (SER) of digital equipment is a major concern: whil...
International audienceThis work presents an approach to predict the error rates due to Single Event ...
International audienceThis paper surveys ten years of experimentation conducted on the Altitude SEE ...