Abstract — This paper presents an adjustment-based modeling frame-work for Statistical Static Timing Analysis (SSTA) when the dimension of parameter variability is high. Instead of building a complex model between the circuit timing and parameter variability, we build a model which adjusts an approximate variation-aware timing into an accurate one. The intuition is that it is simpler to build a model which adjusts an approximate estimate into an accurate one. It is also more efficient to obtain an approximate circuit timing model. The combination of these two observations makes the use of an adjustment-based model a good choice for SSTA with high dimension of parameter variability. To build the adjustment model, we use a simulation-based ap...
This paper proposed the impact of variations on delay in CMOS technology of 32 nm. The magnitude of ...
As CMOS technology scales down, process variation introduces significant uncertainty in power and pe...
With aggressive scaling of CMOS technologies, MOSFET devices are subject to increasing amounts of in...
The effect of process variation is getting worse with every technology generation. With variability ...
Abstract—The most challenging problem in the current block-based statistical static timing analysis ...
Variability of process parameters makes prediction of digital circuit timing characteristics an impo...
An efficient and accurate statistical static timing analysis (SSTA) algorithm is reported in this wo...
Recent study shows that the existing first order canonical timing model is not sufficient to represe...
The move to deep submicron processes has brought about new problems that designers must contend with...
In the nanometer manufacturing region, process variation causes significant uncertainty for circuit ...
This dissertation reports on a new methodology to characterize and simulate a standard cell library ...
As CMOS technology continues to scale down, process variation introduces significant uncertainty in ...
As we are moving toward nanometre technology, the variability in the circuit parameters and operatin...
A vast literature has been published on Statistical Static Timing Analysis (SSTA), its motivations, ...
ISBN 978-0-7685-4970-5International audienceAsynchronous designs are usually composed of conditional...
This paper proposed the impact of variations on delay in CMOS technology of 32 nm. The magnitude of ...
As CMOS technology scales down, process variation introduces significant uncertainty in power and pe...
With aggressive scaling of CMOS technologies, MOSFET devices are subject to increasing amounts of in...
The effect of process variation is getting worse with every technology generation. With variability ...
Abstract—The most challenging problem in the current block-based statistical static timing analysis ...
Variability of process parameters makes prediction of digital circuit timing characteristics an impo...
An efficient and accurate statistical static timing analysis (SSTA) algorithm is reported in this wo...
Recent study shows that the existing first order canonical timing model is not sufficient to represe...
The move to deep submicron processes has brought about new problems that designers must contend with...
In the nanometer manufacturing region, process variation causes significant uncertainty for circuit ...
This dissertation reports on a new methodology to characterize and simulate a standard cell library ...
As CMOS technology continues to scale down, process variation introduces significant uncertainty in ...
As we are moving toward nanometre technology, the variability in the circuit parameters and operatin...
A vast literature has been published on Statistical Static Timing Analysis (SSTA), its motivations, ...
ISBN 978-0-7685-4970-5International audienceAsynchronous designs are usually composed of conditional...
This paper proposed the impact of variations on delay in CMOS technology of 32 nm. The magnitude of ...
As CMOS technology scales down, process variation introduces significant uncertainty in power and pe...
With aggressive scaling of CMOS technologies, MOSFET devices are subject to increasing amounts of in...