Abstract—An approach to study the effects of single event upsets (SEU) by fault injection performed at system-level is presented. It is illustrated by results obtained on two different versions of a matrix multiplication algorithm, one standard and the second with fault tolerance capabilities. The final goal of this work is to validate fault tolerance techniques implemented at software level and provide a feedback about the weakest variables, improving thus their capabilities to tolerate faults. Keywords—SEU; Fault-Injection; System-Level; CPU; Soft Error
Fault tolerant circuits are currently required in several major application sectors. Besides and in ...
Development of highly reliable and available systems requires consideration of the occurrence of sin...
Thesis: M. Eng., Massachusetts Institute of Technology, Department of Electrical Engineering and Com...
International audienceAn approach to study the effects of single event upsets (SEU) by fault injecti...
ISBN 978-1-4673-2355-0International audienceAn approach to study the effects of soft errors by fault...
International audienceThe single-event upset (SEU) fault tolerance of a benchmark self-converging al...
International audienceSingle Event Upset (SEU) phenomena is becoming a major concern in applications...
International audienceIn this paper, a new methodology for the injection of single event upsets (SEU...
In this paper are first summarized representative examples of anomalies observed in systems operatin...
In this paper, two low-cost solutions devoted to provide processor-based systems with error-detectio...
The paper deals with the problem of testing computer system's susceptibility to hardware faults by m...
International audienceThis paper describes two different but complementary approaches that can be us...
International audienceThis paper presents a new fault injection method based on the CEU (Code Emulat...
<p>This thesis deals with techniques for designing and evaluating error detection and recovery mecha...
International audienceThe SEU fault-tolerance of a benchmark self-converging algorithm is evaluated ...
Fault tolerant circuits are currently required in several major application sectors. Besides and in ...
Development of highly reliable and available systems requires consideration of the occurrence of sin...
Thesis: M. Eng., Massachusetts Institute of Technology, Department of Electrical Engineering and Com...
International audienceAn approach to study the effects of single event upsets (SEU) by fault injecti...
ISBN 978-1-4673-2355-0International audienceAn approach to study the effects of soft errors by fault...
International audienceThe single-event upset (SEU) fault tolerance of a benchmark self-converging al...
International audienceSingle Event Upset (SEU) phenomena is becoming a major concern in applications...
International audienceIn this paper, a new methodology for the injection of single event upsets (SEU...
In this paper are first summarized representative examples of anomalies observed in systems operatin...
In this paper, two low-cost solutions devoted to provide processor-based systems with error-detectio...
The paper deals with the problem of testing computer system's susceptibility to hardware faults by m...
International audienceThis paper describes two different but complementary approaches that can be us...
International audienceThis paper presents a new fault injection method based on the CEU (Code Emulat...
<p>This thesis deals with techniques for designing and evaluating error detection and recovery mecha...
International audienceThe SEU fault-tolerance of a benchmark self-converging algorithm is evaluated ...
Fault tolerant circuits are currently required in several major application sectors. Besides and in ...
Development of highly reliable and available systems requires consideration of the occurrence of sin...
Thesis: M. Eng., Massachusetts Institute of Technology, Department of Electrical Engineering and Com...