This letter reports a silicon-based field-induced band-to-band tunneling effect transistor (FIBTET), which has a structure totally compatible with silicon-on-insulator (SOI) MOSFET. The field-induced band-to-band tunneling effect between degenerate channel and source/drain is used as the key principle of the device operation. FIBTETs demonstrate the controllable negative differential transconductance characteristics at room temperature both for n-FIBTETs and p-FIBTETs. The size dependence of the device characteristics shows that the peak tunneling current can be controlled by the layout design of channel length and width.close81
As the conventional metal oxide semiconductor field-effect transistor (MOSFET) keep scaling down to ...
As scaling continues, the number of transistors per unit area and power density are both on the rise...
We present a tunneling field-effect transistor based on a vertical heterostructure of highly p-doped...
A field Induced Band to Band Tunneling Effect Transistor was designed, fabricated and tested. The de...
The fabrication of quantum-tunneling devices based on silicon (Si) technology was described. Channel...
Numerical simulations based on a novel band-to-band tunnelling model and DC quasi-stationary method ...
The fabricated quantum-tunneling devices have a structure totally compatible with silicon-on-insulat...
As the physical dimensions of the MOSFET have been scaling, the supply voltage has not scaled accord...
In the room-temperature I-V characteristics of field-induced interband tunneling-effect transistors ...
Over 40 years of scaling dimensions for new and continuing product cycles has introduced new challen...
Negative-differential transconductance characteristics at room temperature with a peak-to-valley rat...
As number of transistors per unit area in integrated circuits increases, power dissipation of the ch...
For the past decades, down-scaling of metal-oxide-semiconductor field-effect-transistors (MOSFET) de...
The Tunnel-FET (TFET) device is a gated reverse biased p-i-n junction whose working principle is bas...
In this work, we demonstrate a silicon nanocrystal Field Effect Transistor (ncFET). Its operation is...
As the conventional metal oxide semiconductor field-effect transistor (MOSFET) keep scaling down to ...
As scaling continues, the number of transistors per unit area and power density are both on the rise...
We present a tunneling field-effect transistor based on a vertical heterostructure of highly p-doped...
A field Induced Band to Band Tunneling Effect Transistor was designed, fabricated and tested. The de...
The fabrication of quantum-tunneling devices based on silicon (Si) technology was described. Channel...
Numerical simulations based on a novel band-to-band tunnelling model and DC quasi-stationary method ...
The fabricated quantum-tunneling devices have a structure totally compatible with silicon-on-insulat...
As the physical dimensions of the MOSFET have been scaling, the supply voltage has not scaled accord...
In the room-temperature I-V characteristics of field-induced interband tunneling-effect transistors ...
Over 40 years of scaling dimensions for new and continuing product cycles has introduced new challen...
Negative-differential transconductance characteristics at room temperature with a peak-to-valley rat...
As number of transistors per unit area in integrated circuits increases, power dissipation of the ch...
For the past decades, down-scaling of metal-oxide-semiconductor field-effect-transistors (MOSFET) de...
The Tunnel-FET (TFET) device is a gated reverse biased p-i-n junction whose working principle is bas...
In this work, we demonstrate a silicon nanocrystal Field Effect Transistor (ncFET). Its operation is...
As the conventional metal oxide semiconductor field-effect transistor (MOSFET) keep scaling down to ...
As scaling continues, the number of transistors per unit area and power density are both on the rise...
We present a tunneling field-effect transistor based on a vertical heterostructure of highly p-doped...