Continuous technology scaling has brought us to a point, where transistors have become extremely susceptible to cosmic radiation strikes, or soft errors. Inside the processor, caches are most vulnerable to soft errors, and techniques at various levels of design abstraction, e. g., fabrication, gate design, circuit design, and microarchitecture-level, have been developed to protect data in caches. However, no work has been done to investigate the effect of code transformations on the vulnerability of data in caches. Data is vulnerable to soft errors in the cache only if it will be read by the processor, and not if it will be overwritten. Since code transformations can change the read-write pattern of program variables, they significantly eff...
International audienceStatic raw soft-error rates (SER) of COTS microprocessors are classically obta...
International audienceStatic raw soft-error rates (SER) of COTS microprocessors are classically obta...
The problem of soft errors caused by radiation events are expected to get worse with technology scal...
Continuous technology scaling has brought us to a point, where transistors have become extremely sus...
Cache memory is a fundamental component of all modern microprocessors. Caches provide for efficient ...
Soft errors (also called transient errors, or single event upsets) are one of the vital errors that ...
International audienceWith the progress of the technology, the presence of transient faults (e.g. bi...
As the capacity of cache increases dramatically with new processors, soft errors originating in cach...
Cache memory is a fundamental component of all modern microprocessors. Caches provide for efficient ...
Soft errors are an important challenge in contemporary microprocessors. Particle hits on the compone...
Microprocessor memory is sensitive to cold boot attacks. In this kind of attacks, memory remanence i...
Cosmic radiation induced soft errors have emerged as a key challenge in computer system design. The ...
Instruction and data caches are well known architectural solutions that allow significantly improvin...
2012-01-31Benchmarking the FIT (failures in time of 1E9 hours) rates of caches due to soft errors is...
Soft errors are an important challenge in contemporary microprocessors. Particle hits on the compone...
International audienceStatic raw soft-error rates (SER) of COTS microprocessors are classically obta...
International audienceStatic raw soft-error rates (SER) of COTS microprocessors are classically obta...
The problem of soft errors caused by radiation events are expected to get worse with technology scal...
Continuous technology scaling has brought us to a point, where transistors have become extremely sus...
Cache memory is a fundamental component of all modern microprocessors. Caches provide for efficient ...
Soft errors (also called transient errors, or single event upsets) are one of the vital errors that ...
International audienceWith the progress of the technology, the presence of transient faults (e.g. bi...
As the capacity of cache increases dramatically with new processors, soft errors originating in cach...
Cache memory is a fundamental component of all modern microprocessors. Caches provide for efficient ...
Soft errors are an important challenge in contemporary microprocessors. Particle hits on the compone...
Microprocessor memory is sensitive to cold boot attacks. In this kind of attacks, memory remanence i...
Cosmic radiation induced soft errors have emerged as a key challenge in computer system design. The ...
Instruction and data caches are well known architectural solutions that allow significantly improvin...
2012-01-31Benchmarking the FIT (failures in time of 1E9 hours) rates of caches due to soft errors is...
Soft errors are an important challenge in contemporary microprocessors. Particle hits on the compone...
International audienceStatic raw soft-error rates (SER) of COTS microprocessors are classically obta...
International audienceStatic raw soft-error rates (SER) of COTS microprocessors are classically obta...
The problem of soft errors caused by radiation events are expected to get worse with technology scal...