abstract: The drive towards device scaling and large output power in millimeter and sub-millimeter wave power amplifiers results in a highly non-linear, out-of-equilibrium charge transport regime. Particle-based Full Band Monte Carlo device simulators allow an accurate description of this carrier dynamics at the nanoscale. This work initially compares GaN high electron mobility transistors (HEMTs) based on the established Ga-face technology and the emerging N-face technology, through a modeling approach that allows a fair comparison, indicating that the N-face devices exhibit improved performance with respect to Ga-face ones due to the natural back-barrier confinement that mitigates short-channel-effects. An investigation is then carried ou...
Recent improvements in the understanding and fabrication of GaN have led to its application in high ...
Charge trapping effects represent a major challenge in the performance evaluation and the measuremen...
Herein, the results are reviewed concerning reliability of high-electron mobility transistors (HEMTs...
abstract: In this work, the insight provided by our sophisticated Full Band Monte Carlo simulator is...
abstract: In this work, an advanced simulation study of reliability in millimeter-wave (mm-wave) GaN...
The high electron mobility transistors (HEMTs) fabricated using wide-bandgap semiconductors show pro...
In recent years, monolithic integrated power amplifiers based on gallium nitride (GaN) have become a...
Semiconductors technologies are rapidly evolving driven by the need for higher performance demanded...
The objective of this research has been the study of device properties for emerging wide-bandgap cub...
Popular semiconductors currently being used for RF applications include GaAs and InP. The operating ...
Increasing demands on mobile networks to provide high speed data rates has led to fifth generation w...
A self-consistent, full-band, electrothermal ensemble Monte Carlo device simulation tool has been de...
Se han estudiado las características estáticas y dinámicas de HEMTs de doblre puerta (DG-HEMTs) por ...
In high-frequency power-amplifier design, it is common practice to approach the design of reactive m...
Thesis: Ph. D., Massachusetts Institute of Technology, Department of Electrical Engineering and Comp...
Recent improvements in the understanding and fabrication of GaN have led to its application in high ...
Charge trapping effects represent a major challenge in the performance evaluation and the measuremen...
Herein, the results are reviewed concerning reliability of high-electron mobility transistors (HEMTs...
abstract: In this work, the insight provided by our sophisticated Full Band Monte Carlo simulator is...
abstract: In this work, an advanced simulation study of reliability in millimeter-wave (mm-wave) GaN...
The high electron mobility transistors (HEMTs) fabricated using wide-bandgap semiconductors show pro...
In recent years, monolithic integrated power amplifiers based on gallium nitride (GaN) have become a...
Semiconductors technologies are rapidly evolving driven by the need for higher performance demanded...
The objective of this research has been the study of device properties for emerging wide-bandgap cub...
Popular semiconductors currently being used for RF applications include GaAs and InP. The operating ...
Increasing demands on mobile networks to provide high speed data rates has led to fifth generation w...
A self-consistent, full-band, electrothermal ensemble Monte Carlo device simulation tool has been de...
Se han estudiado las características estáticas y dinámicas de HEMTs de doblre puerta (DG-HEMTs) por ...
In high-frequency power-amplifier design, it is common practice to approach the design of reactive m...
Thesis: Ph. D., Massachusetts Institute of Technology, Department of Electrical Engineering and Comp...
Recent improvements in the understanding and fabrication of GaN have led to its application in high ...
Charge trapping effects represent a major challenge in the performance evaluation and the measuremen...
Herein, the results are reviewed concerning reliability of high-electron mobility transistors (HEMTs...