The rigorous coupled-wave analysis (RCWA) is one of the most successful and widely used methods for modeling periodic optical structures. It yields fast convergence of the electromagnetic far-field and has been adapted to model various optical devices and wave configurations. In this article, we investigate the accuracy with which the electromagnetic near-field can be calculated by using RCWA and explain the observed slow convergence and numerical artifacts from which it suffers, namely unphysical oscillations at material boundaries due to the Gibbs phenomenon. In order to alleviate these shortcomings, we also introduce a mathematical formulation for accurate near-field calculation in RCWA, for one- and two-dimensional straight and slanted ...
Diffraction gratings are often used in optical metrology. When an electromagnetic wave is incident o...
Diffraction gratings are often used in optical metrology. When an electromagnetic wave is incident o...
Diffraction gratings are often used in optical metrology. When an electromagnetic wave is incident o...
We present a modification of a well-known mathematical model based on the Rigorous Coupled-Wave Anal...
We present a modification of a well-known mathematical model based on the Rigorous Coupled-Wave Anal...
We present a modification of a well-known mathematical model based on the Rigorous Coupled-Wave Anal...
We present a modification of a well-known mathematical model based on the Rigorous Coupled-Wave Anal...
This work provides a contribution to the numerical problem of electromagnetic wave diffraction. For ...
Among the many existing rigorous methods for analyzing diffraction of electromagnetic waves by diffr...
Diffraction gratings are often used in optical metrology. When an electromagnetic wave is incident o...
The rigorous coupled-wave analysis (RCWA) is a method to compute diffraction of a field by a given g...
The rigorous coupled-wave analysis (RCWA) is a method to compute diffraction of a field by a given g...
The rigorous coupled-wave analysis (RCWA) is a method to compute diffraction of a field by a given g...
The rigorous coupled-wave analysis (RCWA) is a method to compute diffraction of a field by a given g...
The rigorous coupled-wave analysis (RCWA) is a method to compute diffraction of a field by a given g...
Diffraction gratings are often used in optical metrology. When an electromagnetic wave is incident o...
Diffraction gratings are often used in optical metrology. When an electromagnetic wave is incident o...
Diffraction gratings are often used in optical metrology. When an electromagnetic wave is incident o...
We present a modification of a well-known mathematical model based on the Rigorous Coupled-Wave Anal...
We present a modification of a well-known mathematical model based on the Rigorous Coupled-Wave Anal...
We present a modification of a well-known mathematical model based on the Rigorous Coupled-Wave Anal...
We present a modification of a well-known mathematical model based on the Rigorous Coupled-Wave Anal...
This work provides a contribution to the numerical problem of electromagnetic wave diffraction. For ...
Among the many existing rigorous methods for analyzing diffraction of electromagnetic waves by diffr...
Diffraction gratings are often used in optical metrology. When an electromagnetic wave is incident o...
The rigorous coupled-wave analysis (RCWA) is a method to compute diffraction of a field by a given g...
The rigorous coupled-wave analysis (RCWA) is a method to compute diffraction of a field by a given g...
The rigorous coupled-wave analysis (RCWA) is a method to compute diffraction of a field by a given g...
The rigorous coupled-wave analysis (RCWA) is a method to compute diffraction of a field by a given g...
The rigorous coupled-wave analysis (RCWA) is a method to compute diffraction of a field by a given g...
Diffraction gratings are often used in optical metrology. When an electromagnetic wave is incident o...
Diffraction gratings are often used in optical metrology. When an electromagnetic wave is incident o...
Diffraction gratings are often used in optical metrology. When an electromagnetic wave is incident o...