The progress of the semiconductor technology and the resulting increase of the transistor integration density has driven the development of ever more powerful multi-core processors. The reduction of the feature sizes in the direction of the physical limits increases the probabilities of transient, intermittent, and permanent faults in the chips and demands efficient fault-tolerance mechanisms also for future general-purpose multi-core processors. However, the use of redundant execution mechanisms, as they have been implemented in safety-critical and high-availability lockstep systems for a long time, can be expensive in general-purpose processors, since they require changes to the microarchitecture, which can limit the scalability of the sy...
Continued CMOS scaling is expected to make future micro-processors susceptible to transient faults, ...
Reliability becomes a key issue in computer system design as microprocessors are increasingly suscep...
As the number of processors in today’s parallel systems continues to grow, the mean-time-to-failure ...
Um der anhaltenden Nachfrage nach zunehmender Rechenleistung gerecht zu werden, versuchen die Herste...
This work presents a new Dual-Core LockStep approach to enhance fault tolerance in microprocessors. ...
Abstract The high parallelism of future Teradevices, which are going to contain more than 1,000 comp...
The number of cores per processor continues to increase due to higher integration rates and smaller ...
The high parallelism of future Teradevices, which are going to contain more than 1,000 complex cores...
Current and future computing systems must be appropriately designed to cope with random hardware fau...
Modern safety-critical embedded applications like autonomous driving need to be fail-operational, wh...
L'augmentation continue de la puissance de calcul requise par les applications telles que la cryptog...
Future computing systems (Teradevices) will probably contain more than 1000 cores on a single die. T...
© 2014 IEEE. Recent trends in semiconductor technology have dictated the constant reduction of devic...
In this dissertation we address the overhead reduction of fault tolerance (FT) techniques. Due to te...
Safety critical embedded systems often require redundant hardware to guarantee correct operation. Ty...
Continued CMOS scaling is expected to make future micro-processors susceptible to transient faults, ...
Reliability becomes a key issue in computer system design as microprocessors are increasingly suscep...
As the number of processors in today’s parallel systems continues to grow, the mean-time-to-failure ...
Um der anhaltenden Nachfrage nach zunehmender Rechenleistung gerecht zu werden, versuchen die Herste...
This work presents a new Dual-Core LockStep approach to enhance fault tolerance in microprocessors. ...
Abstract The high parallelism of future Teradevices, which are going to contain more than 1,000 comp...
The number of cores per processor continues to increase due to higher integration rates and smaller ...
The high parallelism of future Teradevices, which are going to contain more than 1,000 complex cores...
Current and future computing systems must be appropriately designed to cope with random hardware fau...
Modern safety-critical embedded applications like autonomous driving need to be fail-operational, wh...
L'augmentation continue de la puissance de calcul requise par les applications telles que la cryptog...
Future computing systems (Teradevices) will probably contain more than 1000 cores on a single die. T...
© 2014 IEEE. Recent trends in semiconductor technology have dictated the constant reduction of devic...
In this dissertation we address the overhead reduction of fault tolerance (FT) techniques. Due to te...
Safety critical embedded systems often require redundant hardware to guarantee correct operation. Ty...
Continued CMOS scaling is expected to make future micro-processors susceptible to transient faults, ...
Reliability becomes a key issue in computer system design as microprocessors are increasingly suscep...
As the number of processors in today’s parallel systems continues to grow, the mean-time-to-failure ...