We report an innovative method to explore the optimal experimental settings to detect light atoms from scanning transmission electron microscopy (STEM) images. Since light elements play a key role in many technologically important materials, such as lithium-battery devices or hydrogen storage applications, much effort has been made to optimize the STEM technique in order to detect light elements. Therefore, classical performance criteria, such as contrast or signal-to-noise ratio, are often discussed hereby aiming at improvements of the direct visual interpretability. However, when images are interpreted quantitatively, one needs an alternative criterion, which we derive based on statistical detection theory. Using realistic simulations of ...
The microscopic world at the atomic scale seems very remote from our daily lives. Still, we exploit ...
Atomic resolution imaging of light elements in electron-transparent materials has long been a challe...
Large area electron microscopy (EM) imaging has long been difficult due to fundamental limits in thr...
We report an innovative method to explore the optimal experimental settings to detect light atoms fr...
In the present paper, the optimal detector design is investigated for both detecting and locating li...
In the present paper, the optimal detector design is investigated for both detecting and locating li...
Single atom detection is of key importance to solving a wide range of scientific and technological p...
A quantitative measure is proposed to evaluate and optimize the design of a high-resolution scanning...
Single atom detection is of key importance to solving a wide range of scientific and technological p...
Single atom detection is of key importance to solving a wide range of scientific and technological p...
Single atom detection is of key importance to solving a wide range of scientific and technological p...
Single atom detection is of key importance to solving a wide range of scientific and technological p...
In electron microscopy, the maximum a posteriori (MAP) probability rule has been introduced as a too...
Observing processes of nanoscale materials of low atomic number is possible using liquid phase elect...
Observing processes of nanoscale materials of low atomic number is possible using liquid phase elect...
The microscopic world at the atomic scale seems very remote from our daily lives. Still, we exploit ...
Atomic resolution imaging of light elements in electron-transparent materials has long been a challe...
Large area electron microscopy (EM) imaging has long been difficult due to fundamental limits in thr...
We report an innovative method to explore the optimal experimental settings to detect light atoms fr...
In the present paper, the optimal detector design is investigated for both detecting and locating li...
In the present paper, the optimal detector design is investigated for both detecting and locating li...
Single atom detection is of key importance to solving a wide range of scientific and technological p...
A quantitative measure is proposed to evaluate and optimize the design of a high-resolution scanning...
Single atom detection is of key importance to solving a wide range of scientific and technological p...
Single atom detection is of key importance to solving a wide range of scientific and technological p...
Single atom detection is of key importance to solving a wide range of scientific and technological p...
Single atom detection is of key importance to solving a wide range of scientific and technological p...
In electron microscopy, the maximum a posteriori (MAP) probability rule has been introduced as a too...
Observing processes of nanoscale materials of low atomic number is possible using liquid phase elect...
Observing processes of nanoscale materials of low atomic number is possible using liquid phase elect...
The microscopic world at the atomic scale seems very remote from our daily lives. Still, we exploit ...
Atomic resolution imaging of light elements in electron-transparent materials has long been a challe...
Large area electron microscopy (EM) imaging has long been difficult due to fundamental limits in thr...