Preliminary Results of NETFI-2: An Automatic Method for Fault Injection on HDL-Based Designs

International audienceFault injection is a well-known technique to evaluate the susceptibility of integrated circuits to the effects of radiation.In this work, an existing emulation-based methodology is extended, updated and improved under the name of NETFI-2.Preliminary results show that NETFI-2 provides accurate measurements while improving the execution time of the experiment by more than 300\% compared with other simulation-based campaigns