ARM processors are leaders in embedded systems, delivering high-performance computing, power efficiency, and reduced cost. For this reason, there is a relevant interest for its use in the aerospace industry. However, the use of sub-micron technologies has increased the sensitivity to radiation-induced transient faults. Thus, the mitigation of soft errors has become a major concern. Software-Implemented Hardware Fault Tolerance (SIHFT) techniques are a low-cost way to protect processors against soft errors. On the other hand, they cause high overheads in the execution time and memory, which consequently increase the energy consumption. In this work, we implement a set of software techniques based on different redundancy and checking rules. F...
The embedded processors operating in safety- or mission-critical systems are not allowed to fail. An...
This paper presents a solution for error detection in ARM microprocessors based on the use of the tr...
Proceeding of: 32th European Symposium on Reliability of Electron Devices, Failure Physics and Analy...
Software-based fault tolerance techniques are a low-cost way to protect processors against soft erro...
This article presents a software protection technique against radiation-induced faults which is base...
Comunicación presentada en the 11th European Conference on Radiation and its Effects on Components a...
A mathematical model is described to predict microprocessor fault tolerance under radiation. The mod...
Commercial off-the-shelf microprocessors are the core of low-cost embedded systems due to their prog...
Random hardware faults are a major concern for critical systems, especially when they are employed i...
Soft errors are one of the significant design technology challenges at smaller technology nodes and ...
This work presents the evaluation of a new dualcore lockstep hybrid approach aimed to improve the fa...
All-Programmable System-on-Chips (APSoCs) constitute a compelling option for employing applications ...
Due to technology scaling, which means reduced transistor size, higher density, lower voltage and mo...
The complexity of integrated system on-chips as well as commercial processor’s architecture has incr...
The negative impact of the aggressive scaling of technology nodes on the sensitivity of CMOS devices...
The embedded processors operating in safety- or mission-critical systems are not allowed to fail. An...
This paper presents a solution for error detection in ARM microprocessors based on the use of the tr...
Proceeding of: 32th European Symposium on Reliability of Electron Devices, Failure Physics and Analy...
Software-based fault tolerance techniques are a low-cost way to protect processors against soft erro...
This article presents a software protection technique against radiation-induced faults which is base...
Comunicación presentada en the 11th European Conference on Radiation and its Effects on Components a...
A mathematical model is described to predict microprocessor fault tolerance under radiation. The mod...
Commercial off-the-shelf microprocessors are the core of low-cost embedded systems due to their prog...
Random hardware faults are a major concern for critical systems, especially when they are employed i...
Soft errors are one of the significant design technology challenges at smaller technology nodes and ...
This work presents the evaluation of a new dualcore lockstep hybrid approach aimed to improve the fa...
All-Programmable System-on-Chips (APSoCs) constitute a compelling option for employing applications ...
Due to technology scaling, which means reduced transistor size, higher density, lower voltage and mo...
The complexity of integrated system on-chips as well as commercial processor’s architecture has incr...
The negative impact of the aggressive scaling of technology nodes on the sensitivity of CMOS devices...
The embedded processors operating in safety- or mission-critical systems are not allowed to fail. An...
This paper presents a solution for error detection in ARM microprocessors based on the use of the tr...
Proceeding of: 32th European Symposium on Reliability of Electron Devices, Failure Physics and Analy...