A modified design of the transmission line model test structure uses the simple calculation of specific contact resistance, ρc, based on a two contact linear pattern but without the requirement of a mesa etch. This modified structure uses a linear TLM with semicircular terminations at each end. The function of the semicircular terminations is to confine the fringing fields at the ends of the linear TLM contacts. Simple analytical equations for determining ρc have been developed on the basis of the modified linear TLM pattern. These calculations have shown good agreement with a finite element model (FEM) of the modified TLM test structure using typical parameters for metal/ SiC contacts
We apply the contact\u2013end resistance method to TLM structures in order to characterize the graph...
The standard transmission‐line model (TLM) for specific contact resistivity measurements of planar c...
The paper proposes a simple model for contact resistance in the Berger and Kelvin structures which a...
The metal resistance in the transmission line model (TLM) structures creates a serious obstacle to d...
Low resistance ohmic contacts are of extreme importance to modern semiconductor devices. As device s...
Our research comprises the manufacturing of test structures to characterize the metal-semiconductor ...
Knowledge of the interfacial contact impedance offered by the device at its operating frequency rang...
Reeves's CTLM was reviewed and its scope of application to extract specific contact resistance ...
Our research comprises the manufacturing of test structures to characterize the metal-semiconductor ...
Contact test structures where there is more than one non-metal layer, are significantly more complex...
Test structures for the determination of specific contact resistance are an area of continual resear...
The transmission line method (TLM) is often used in characterizing the contact resistance of c-Si so...
We propose a very large scale integration compatible, modified transfer length method (TLM) structur...
The performance of electrical contacts, which are inevitable in the electricity distribution system ...
We present a numerical method to extract specific contact resistivity (SCR) for three-dimensional (3...
We apply the contact\u2013end resistance method to TLM structures in order to characterize the graph...
The standard transmission‐line model (TLM) for specific contact resistivity measurements of planar c...
The paper proposes a simple model for contact resistance in the Berger and Kelvin structures which a...
The metal resistance in the transmission line model (TLM) structures creates a serious obstacle to d...
Low resistance ohmic contacts are of extreme importance to modern semiconductor devices. As device s...
Our research comprises the manufacturing of test structures to characterize the metal-semiconductor ...
Knowledge of the interfacial contact impedance offered by the device at its operating frequency rang...
Reeves's CTLM was reviewed and its scope of application to extract specific contact resistance ...
Our research comprises the manufacturing of test structures to characterize the metal-semiconductor ...
Contact test structures where there is more than one non-metal layer, are significantly more complex...
Test structures for the determination of specific contact resistance are an area of continual resear...
The transmission line method (TLM) is often used in characterizing the contact resistance of c-Si so...
We propose a very large scale integration compatible, modified transfer length method (TLM) structur...
The performance of electrical contacts, which are inevitable in the electricity distribution system ...
We present a numerical method to extract specific contact resistivity (SCR) for three-dimensional (3...
We apply the contact\u2013end resistance method to TLM structures in order to characterize the graph...
The standard transmission‐line model (TLM) for specific contact resistivity measurements of planar c...
The paper proposes a simple model for contact resistance in the Berger and Kelvin structures which a...