Thin film analysis of chromium-phosphate conversion coatings on aluminum probed by ToF-SIMS and electron probe X-ray analysis
- Cuynen, Erik
- Goeminne, Gudrun
- Van Espen, Pierre
- Terryn, Herman
DOIAbstract
Time-of-flight SIMS was used to study chromium phosphate conversion layers on Al. During coating formation, fluorine is buried under a layer of CrPxOy as the layer thickens, yielding a duplex layer structure. Electron probe x-ray microanalysis was used to assess the variation in elemental composition of the coating. Preliminary results demonstrate a number of problems related to quantitative analysis of the coatings studied.SCOPUS: ar.jFLWINinfo:eu-repo/semantics/publishe
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