On the randomness of Field Coupled Nanomagnets

With the advancement of fabrication processes, single domain nanomagnets devices are being exploited to design digital logic circuits. In this work we evaluate the exploitability of nanomagnetic technologies to design cryptographic devices, such as True Random Number Generators and Physical Unclonable Functions. To quantify the source randomness we use the tests defined in NIST SP 800-22 [1] while for simulate the electronic devices we use micromagnetic simulations and Digital Signal Processing to reproduce circuit binary response