HIGH RESOLUTION STUDIES OF THE SPECTRA OF GeCl AND SnCl

$^{1}$R. K. Mishra and B. N. Khanna, Ind. J. Pure Appl. Phys. 8, 825 (1970). $^{2}$A. Chatalic, D. Iacocca and G. Pannetier, J, Chim. Phys. 70, 481 (1973).""Author Institution: Institute of Inorganic Chemistry and Metallurgy of Rare Elements, Technical University of Wrocac{\l}awSpectra of GeCl and SnCl were excited in a radio frequency discharge at a low pressure. Bands of the GeCl molecule in the region 335-370 nm have been attributed to the $^{4}\Sigma^{-}- X^{2}\Pi$ transition on the basis of high resolution studies of the bands at 339.2 and 350.1 nm. The rotational analysis of the (0,0) band of the $^{4}\Sigma^{-}_{3/2} - X^{2}\Pi_{3/2}$ subsystem has been carried out. The $B^{\prime\prime}_{O}$ value obtained by the author disagrees with that derived from a rotational analysis of the $B^{2}\Sigma^{+} - X^{2}\Pi_{3/2}$ $subsystem^{1}$ The (0,0) subbands at 348.6 and 375.8 nm of the $^{4}\Sigma^{-} X^{2}\Pi$ system of the SnCl molecule have been recorded at high resolution and analyzed. The rotational constants for the $^{4}\Sigma^{-}_{1/2}, ^{4}\Sigma^{-}_{3/2}, X^{2}\Pi_{1/2}$ and $X^{2}\Pi_{3/2}$ states have been calculated. The constants calculated by the author agree well with the previous results for the $^{4}\Sigma^{-}_{3/2}, X^{2}\Pi_{1/2}$ and $X^{2}\Pi_{3/2}$ $substates^{2}