The noise in an electron microscope (EM) image is determined by the dose of electrons, the detection efficiency of the scattered electrons and the properties of the object under the microscope. At present, the amount of noise in EM images is often determined manually. Unfortunately, this method has proven to be inadequate for certain types of images and it does not suffice when the noise should be detected automatically. Another method is based on taking multiple images and obtaining for each pixel both the average brightness and its variance, but this method is not able to deal with images having different points of origin, caused by objects slightly drifting while the images are created. In this bachelor thesis, the standard method of dea...
The work concerns with working out of a method enabling quantification of detection effectiveness o...
Bachelor thesis deals with the issue of noise reduction in magnetic resonance imaging. In this thesi...
Most of the specimens for high-resolution electron microscopy have amorphous surface layers due to c...
This thesis deals with methods of improving the quality of image output of an electron microscope by...
Recent research in several fields such as Biotechnology and Healthcare has uncovered a vast number o...
This paper investigates noise characteristics of detector preamplifier in electron scanning microsco...
This bachelor's thesis deals with problems of environmental scanning electron microscopy and with de...
Achievement of an optimal improvement in signal-to-noise ratio from image averaging techniques depen...
International audienceNoise estimation is a crucial part of any modern supervised denoiser. Various ...
This work is focused on investigating of influence of different working conditions in scanning elect...
The main problem addressed by this dissertation is the accurate and automated determination of elect...
This bachelor project includes information about function of low vacuum scanning electron microscope...
This article is summarizing the general subtask pipeline during the processing and analysis of elect...
This thesis describes the physical nature of corrections of an electron microscope and mathematical ...
Práce se zabývá jedním z parazitních vlivů působících na elektronový mikroskop během pořizování sním...
The work concerns with working out of a method enabling quantification of detection effectiveness o...
Bachelor thesis deals with the issue of noise reduction in magnetic resonance imaging. In this thesi...
Most of the specimens for high-resolution electron microscopy have amorphous surface layers due to c...
This thesis deals with methods of improving the quality of image output of an electron microscope by...
Recent research in several fields such as Biotechnology and Healthcare has uncovered a vast number o...
This paper investigates noise characteristics of detector preamplifier in electron scanning microsco...
This bachelor's thesis deals with problems of environmental scanning electron microscopy and with de...
Achievement of an optimal improvement in signal-to-noise ratio from image averaging techniques depen...
International audienceNoise estimation is a crucial part of any modern supervised denoiser. Various ...
This work is focused on investigating of influence of different working conditions in scanning elect...
The main problem addressed by this dissertation is the accurate and automated determination of elect...
This bachelor project includes information about function of low vacuum scanning electron microscope...
This article is summarizing the general subtask pipeline during the processing and analysis of elect...
This thesis describes the physical nature of corrections of an electron microscope and mathematical ...
Práce se zabývá jedním z parazitních vlivů působících na elektronový mikroskop během pořizování sním...
The work concerns with working out of a method enabling quantification of detection effectiveness o...
Bachelor thesis deals with the issue of noise reduction in magnetic resonance imaging. In this thesi...
Most of the specimens for high-resolution electron microscopy have amorphous surface layers due to c...