ÐFor the relative amplitude of the random telegraph signal noise (RTS) in a MOS transistor DG/G=DI/I=1/N= qgm/WlCoxI often holds with N the total number of free carriers. Here, strong deviations from this simple behavior will be explained in terms of strategic (high ®eld region) or less strategic trap positions (low ®eld region) in a non-uniform channel ignoring mobility modulation. Cal- culations show that in a channel with N=103 and a nonuniform current distribution, the relative RTS amplitude can vary between 10 ÿ5 and 10 ÿ2. The analytical expressions to calculate the relative ampli- tude of the RTS noise for two and four terminal geometries are presented. The levelling o¿ in the 1/N dependence for extremely low N in the subthreshold re...
In this paper, we present measurements and simulation of random telegraph signal (RTS) noise in n-ch...
As one of the important sources of lowfrequency noise, random telegraph noise (RTN) in tunnel FET (T...
We have found a systematic way to identify the bias conditions to observe the Random-Telegraph-Noise...
ÐFor the relative amplitude of the random telegraph signal noise (RTS) in a MOS transistor DG/G=DI/I...
This letter presents a numerical investigation of the statistical distribution of the random telegra...
This letter presents a numerical investigation of the statistical distribution of the random telegra...
In this paper, the anomalously large random telegraph signal (RTS) noise amplitudes in tunneling fie...
The random telegraph noise (RTN) of tunnel field-effect transistors (TFETs) has been investigated. I...
The Iowlfreqnency noise power specrrunz qf small dimension MOSFETs is dominated by Lorenniuns arisin...
The origin of 1/f-like noise in devices is still under discussion. There is one school of thought ex...
In this paper, the amplitude (Delta I-d/I-d) distribution of random telegraph noise (RTN) induced by...
With decreasing device dimensions of MOSFETs, the nature of the low-frequency noise spectrum is a Lo...
In this paper, we present measurements and simulation of random telegraph signal (RTS) noise in n-ch...
In this work, we study random telegraph signal (RTS) noise in metal-oxide-semiconductor field effect...
The low-frequency noise power spectrum of small dimension MOSFETs is dominated by Lorentzians arisin...
In this paper, we present measurements and simulation of random telegraph signal (RTS) noise in n-ch...
As one of the important sources of lowfrequency noise, random telegraph noise (RTN) in tunnel FET (T...
We have found a systematic way to identify the bias conditions to observe the Random-Telegraph-Noise...
ÐFor the relative amplitude of the random telegraph signal noise (RTS) in a MOS transistor DG/G=DI/I...
This letter presents a numerical investigation of the statistical distribution of the random telegra...
This letter presents a numerical investigation of the statistical distribution of the random telegra...
In this paper, the anomalously large random telegraph signal (RTS) noise amplitudes in tunneling fie...
The random telegraph noise (RTN) of tunnel field-effect transistors (TFETs) has been investigated. I...
The Iowlfreqnency noise power specrrunz qf small dimension MOSFETs is dominated by Lorenniuns arisin...
The origin of 1/f-like noise in devices is still under discussion. There is one school of thought ex...
In this paper, the amplitude (Delta I-d/I-d) distribution of random telegraph noise (RTN) induced by...
With decreasing device dimensions of MOSFETs, the nature of the low-frequency noise spectrum is a Lo...
In this paper, we present measurements and simulation of random telegraph signal (RTS) noise in n-ch...
In this work, we study random telegraph signal (RTS) noise in metal-oxide-semiconductor field effect...
The low-frequency noise power spectrum of small dimension MOSFETs is dominated by Lorentzians arisin...
In this paper, we present measurements and simulation of random telegraph signal (RTS) noise in n-ch...
As one of the important sources of lowfrequency noise, random telegraph noise (RTN) in tunnel FET (T...
We have found a systematic way to identify the bias conditions to observe the Random-Telegraph-Noise...