Real time detection of the epitaxial growth of oligothiophene layers by reflectance anisotropy spectroscopy
- BUSSETTI, GIANLORENZO
- Goletti, C.
- Chiaradia, P.
- Sassella, A.
- Campione, M.
- Tavazzi, S.
- Borghesi, A.
DOIAbstract
The growth process of thin films and multilayers of quaterthiophene and sexithiophene onto molecular single crystals has been monitored in situ and in real time during deposition by organic molecular beam epitaxy, measuring the anisotropy of the optical reflectivity. The evolution of the spectra with thickness provides the signature of an epitaxial growth of the films. © 2007 Elsevier B.V. All rights reserved
Add to ORKG