We study the motion of voids in conductors subject to intense electrical current densities. We use a free-boundary model in which the flow of current around the insulating void is coupled to a law of motion (kinematic condition) for the void boundary. In the first part of the paper, we apply a new complex variable formulation of the model to an infinite domain and use this to (i) consider the stability of circular and flat front travelling waves, (ii) show that, in the unbounded metal domain, the only travelling waves of finite void area are circular, and (iii) consider possible static solutions. In the second part of the paper, we look at a conducting strip (which can be used to model interconnects in electronic devices) and use asymptotic...
A comprehensive picture of void dynamics in connection with the critical morphological evolution has...
International audienceThe work described in the present paper is about electromigration induced void...
Electromigration (EM) is the transport of atoms and ions in metals at high electrical current-densit...
The void electromigration process in the strip geometry is investigated analytically and numerically...
This thesis addresses electromigration-induced void dynamics in metallic thin films. This has been a...
Continued research in electronic engineering technology has led to a miniaturisation of integrated c...
Surface electromigration refers to the directed motion of atoms at solid surfaces and interfaces whi...
Electromigration failure in rigidly passivated metal interconnect lines is studied with particular r...
The behavior of electromigration-induced voids in narrow, unpassivated aluminum interconnects is exa...
Creep flow, diffusion, and electromigration in small void radius. Previous studies on electromigrati...
We study the time evolution of a perturbation to the edge of an otherwise straight, current-carrying...
Electromigration is the transport of atoms in metal conductors at high electronic current-densities ...
A well-posed moving boundary-value problem, describing the dynamics of curved interfaces and surface...
In this paper the problem of the current flow between the two electrodes is further continued. The s...
Modeling and simulation of the temporal evolution of electromigration voids are critical to evaluate...
A comprehensive picture of void dynamics in connection with the critical morphological evolution has...
International audienceThe work described in the present paper is about electromigration induced void...
Electromigration (EM) is the transport of atoms and ions in metals at high electrical current-densit...
The void electromigration process in the strip geometry is investigated analytically and numerically...
This thesis addresses electromigration-induced void dynamics in metallic thin films. This has been a...
Continued research in electronic engineering technology has led to a miniaturisation of integrated c...
Surface electromigration refers to the directed motion of atoms at solid surfaces and interfaces whi...
Electromigration failure in rigidly passivated metal interconnect lines is studied with particular r...
The behavior of electromigration-induced voids in narrow, unpassivated aluminum interconnects is exa...
Creep flow, diffusion, and electromigration in small void radius. Previous studies on electromigrati...
We study the time evolution of a perturbation to the edge of an otherwise straight, current-carrying...
Electromigration is the transport of atoms in metal conductors at high electronic current-densities ...
A well-posed moving boundary-value problem, describing the dynamics of curved interfaces and surface...
In this paper the problem of the current flow between the two electrodes is further continued. The s...
Modeling and simulation of the temporal evolution of electromigration voids are critical to evaluate...
A comprehensive picture of void dynamics in connection with the critical morphological evolution has...
International audienceThe work described in the present paper is about electromigration induced void...
Electromigration (EM) is the transport of atoms and ions in metals at high electrical current-densit...