Functional verification is generally regarded as the most critical phase in the successful development of digital integrated circuits. The increasing complexity and size of chip designs make it more challenging to find bugs and meet test coverage goals in time for market demands. These challenges have led to more automated methods of simulation with constrained random test generation and coverage analysis. Recent goals in industry have focused on improving the process further by applying Coverage Directed Test Generation (CDG) to automate the feedback from coverage analysis to test input generation. Previous research has presented Bayesian networks as a way to achieve CDG. Bayesian networks provide a means of capturing behaviors of a design...
Testing plays a vital role in reducing uncertainty but is resource intensive and identifying the bes...
The functional verification process is one of the most expensive steps in integrated circuit manufac...
With increasing design complexity, post-silicon validation has become a critical problem. In pre-sil...
Functional verification is generally regarded as the most critical phase in the successful developme...
Functional verification is widely acknowledged as the bottleneck in the hardware design cycle. This ...
Functional verification is widely acknowledged as the bottleneck in the hardware design cycle. This ...
Coverage Directed Test Generation (CDG) is a technique for providing feedback from the coverage doma...
Functional verification is generally regarded as the most critical phase in the successful developme...
Functional Verification is considered to be a major bottleneck in the hardware design cycle. One of ...
Graduation date: 1994This thesis describes research to implement a Bayesian belief network based\ud ...
In this paper, we claim that software development will do well by explicit modeling of its uncertain...
Testing accounts for the major percentage of technical contribution in the software development proc...
Functional verification is a major challenge of the hardware design development and verification cyc...
Design verification has been a challenging problem due to the increasing complexity of modern system...
Improving the efficiency of simulation-based validation is important. Most of simulation vectors for...
Testing plays a vital role in reducing uncertainty but is resource intensive and identifying the bes...
The functional verification process is one of the most expensive steps in integrated circuit manufac...
With increasing design complexity, post-silicon validation has become a critical problem. In pre-sil...
Functional verification is generally regarded as the most critical phase in the successful developme...
Functional verification is widely acknowledged as the bottleneck in the hardware design cycle. This ...
Functional verification is widely acknowledged as the bottleneck in the hardware design cycle. This ...
Coverage Directed Test Generation (CDG) is a technique for providing feedback from the coverage doma...
Functional verification is generally regarded as the most critical phase in the successful developme...
Functional Verification is considered to be a major bottleneck in the hardware design cycle. One of ...
Graduation date: 1994This thesis describes research to implement a Bayesian belief network based\ud ...
In this paper, we claim that software development will do well by explicit modeling of its uncertain...
Testing accounts for the major percentage of technical contribution in the software development proc...
Functional verification is a major challenge of the hardware design development and verification cyc...
Design verification has been a challenging problem due to the increasing complexity of modern system...
Improving the efficiency of simulation-based validation is important. Most of simulation vectors for...
Testing plays a vital role in reducing uncertainty but is resource intensive and identifying the bes...
The functional verification process is one of the most expensive steps in integrated circuit manufac...
With increasing design complexity, post-silicon validation has become a critical problem. In pre-sil...