Effects of Plasma Radiation on the Thomson Scattering Diagnostic Installed on the Large Helical Device

Recently we modified the Thomson scattering diagnostic (TS) installed on LHD so that DC levels (VDC) of all avalanche photodiodes (APD) used for detecting scattered light can be registered every 1 ms, which enabling us to make validity check on TS data taken under very intense plasma radiation. In the line of this task, we first examined how the pulse-performance of an APD degrades as the intensity of continuous light (JDC) incident to the APD increases. We found two effects are involved in deteriorating the pulse-performance of the APD: (1) the responsivity of the APD to a pulsed light drops as JDC increases, causing a systematic errors on the deduced electron temperature (Te) and density (ne); (2) the frequency response of the APD and the following circuit drops as JDC increases, which deforms the pulse shape. The bias voltage applied to the APD (Vb) has large influence on these behaviors, showing the best overall performance for a high JDC around Vb ? 0.5Vr, where Vr is the recommended voltage giving responsivity of 675 kV/W at 1060 nm. Considering these effects together, we set a conservative validity criterion for the pulse APD performance in term of the VDC: VDC < 0.5 V. The Vb = 0.5 Vr setup gives much reliable Te-profiles without a collapse in Te-profile for a much wider range of plasma radiation intensity. With this criterion, we check the validity of Te- and ne-profiles of two example data